Paper
31 August 2005 Novel technologies for x-ray multi-foil optics
R. Hudec, L. Pina, A. Inneman, L. Sveda, V. Semencova, M. Skulinova, V. Brozek, M. Mika, R. Kacerovsky, J. Sik
Author Affiliations +
Abstract
The future large space X-ray telescopes in study (such as the ESAs XEUS) require novel approaches and innovative lightweight technologies. Although there are several alternative possibilities, in general the shaped thin glass foils and shaped Si wafers are considered to belong to the most promising ones. We present and discuss the recent progress in these technologies, as well as properties of test mirrors produced and tested. For both technologies, both flat and curved samples have been produced and tested. The achieved profile accuracy is of order of 1 micrometer or better, while the bending technologies maintain the intrinsic fine surface microroughness of substrates (better than 0.5 nm).
© (2005) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
R. Hudec, L. Pina, A. Inneman, L. Sveda, V. Semencova, M. Skulinova, V. Brozek, M. Mika, R. Kacerovsky, and J. Sik "Novel technologies for x-ray multi-foil optics", Proc. SPIE 5900, Optics for EUV, X-Ray, and Gamma-Ray Astronomy II, 59000Y (31 August 2005); https://doi.org/10.1117/12.620425
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Cited by 5 scholarly publications.
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KEYWORDS
Glasses

Semiconducting wafers

Silicon

X-ray optics

X-rays

Carbon

X-ray technology

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