Dynamic aberration control testbed for the characterization of multiple wavefront sensors

Jonathan Andrews; Scott Teare; Sergio Restaino; Christopher Wilcox; David Wick; Hai Xiao; Jim Schwiegerling

doi:10.1117/12.669291

8 June 2006 Dynamic aberration control testbed for the characterization of multiple wavefront sensors

Jonathan Andrews, Scott Teare, Sergio Restaino, Christopher Wilcox, David Wick, Hai Xiao, Jim Schwiegerling

Proceedings Volume 6018, 5th International Workshop on Adaptive Optics for Industry and Medicine; 60180R (2006) https://doi.org/10.1117/12.669291
Event: 5th International Workshop on Adaptive Optics for Industry and Medicine, 2005, Beijing, China

Abstract

An optical testbed has been developed for the comparative analysis of wavefront sensors based on a modified Mach Zender interferometer design. This system provides simultaneous measurements of the wavefront sensors on the same camera by using a common aberrator. The initial application for this testbed was to evaluate a Shack-Hartmann and Phase Diversity wavefront sensors referenced to a Mach-Zender interferometer. This testbed has the added benefit of being able to train the deformable mirror against the spatial light modulator and evaluate its ability to compensate the spatial light modulator. In the paper we present some results from the wavefront sensors along with preliminary results from the wavefront corrective elements in the optical testbed.

Citation Download Citation

Jonathan Andrews, Scott Teare, Sergio Restaino, Christopher Wilcox, David Wick, Hai Xiao, and Jim Schwiegerling "Dynamic aberration control testbed for the characterization of multiple wavefront sensors", Proc. SPIE 6018, 5th International Workshop on Adaptive Optics for Industry and Medicine, 60180R (8 June 2006); https://doi.org/10.1117/12.669291

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