Paper
9 December 2005 The effect of transparent film on its surface 3-D mapping by using vertical scanning white light interferometer
Xiaodong Wu, Feng Lei, Toyohiko Yatagai
Author Affiliations +
Proceedings Volume 6024, ICO20: Optical Devices and Instruments; 60241N (2005) https://doi.org/10.1117/12.666868
Event: ICO20:Optical Devices and Instruments, 2005, Changchun, China
Abstract
We have investigated the effect of transparent thin film while mapping its surface profile by using vertical scanning white light interferometer. Our theory analysis showed that multiple reflections taking place within the transparent thin film result in an extra phase change. The simulation and experiment results revealed that this extra phase change is also related to the thickness of thin film, the numerical number of microscope interferometer objective and the spectral distribution of light source. As a result of extra phase change, the interferogram has some deviation in its shape or two interference fringes may appears while the thickness of thin film is large.
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Xiaodong Wu, Feng Lei, and Toyohiko Yatagai "The effect of transparent film on its surface 3-D mapping by using vertical scanning white light interferometer", Proc. SPIE 6024, ICO20: Optical Devices and Instruments, 60241N (9 December 2005); https://doi.org/10.1117/12.666868
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KEYWORDS
Thin films

Interferometers

Reflection

Light sources

Microscopes

Mirau interferometers

Objectives

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