Extraction of orthogonal incident state of polarization spectra using Mueller matrix approach

Éric Desfonds; Kirill Pimenov; Samuel Weaver

doi:10.1117/12.655201

3 March 2006 Extraction of orthogonal incident state of polarization spectra using Mueller matrix approach

Éric Desfonds, Kirill Pimenov, Samuel Weaver

Author Affiliations +

Proceedings Volume 6124, Optoelectronic Integrated Circuits VIII; 61240D (2006) https://doi.org/10.1117/12.655201
Event: Integrated Optoelectronic Devices 2006, 2006, San Jose, California, United States

Abstract

Novel algorithms based upon Mueller matrix terms are presented herein, which allow the recovery of the spectra associated with incident transverse electrical (TE) and transverse magnetic (TM) orthogonal states of polarization. These, in turn, give more insight into polarization-dependent frequency shifts and other performance-related parameters of interest. This elegant patent-pending solution entails little computational efforts and can significantly improved the testing capacity and capabilities of component designers and contract manufacturers.

Citation Download Citation

Éric Desfonds, Kirill Pimenov, and Samuel Weaver "Extraction of orthogonal incident state of polarization spectra using Mueller matrix approach", Proc. SPIE 6124, Optoelectronic Integrated Circuits VIII, 61240D (3 March 2006); https://doi.org/10.1117/12.655201

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