Paper
1 March 2006 Ultrahigh resolution photonic crystal nanoprobe for high-density optical data storage, near-field microscopy, and nanolithography systems
Ahmed Sharkawy, Greg Bermnhan, Shouyuan Shi, Thomas Dillion, Dennis W. Prather
Author Affiliations +
Abstract
In this paper we present the implementation, optimization and commercialization of an ultra-high resolution nano-probe in near field scanning optical microscopy/ spectroscopy (SNOM), nanolithography and high density optical data storage. The theme underlying this effort is the ability to examine or be able to write and/or read ultra fine feature sizes using near field based nano probes. The reason for pursing such research lies in the opportunities it offers for extending the applications of conventional optical microscopy into the nano meter scale domain. Furthermore near-field optical imaging preserves the inherent polarizing, non-invasive, spectroscopic and high temporal resolving capabilities of conventional microscopy, which are absent from other high-resolution techniques
© (2006) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Ahmed Sharkawy, Greg Bermnhan, Shouyuan Shi, Thomas Dillion, and Dennis W. Prather "Ultrahigh resolution photonic crystal nanoprobe for high-density optical data storage, near-field microscopy, and nanolithography systems", Proc. SPIE 6128, Photonic Crystal Materials and Devices IV, 61281R (1 March 2006); https://doi.org/10.1117/12.646070
Lens.org Logo
CITATIONS
Cited by 1 scholarly publication.
Advertisement
Advertisement
RIGHTS & PERMISSIONS
Get copyright permission  Get copyright permission on Copyright Marketplace
KEYWORDS
Near field scanning optical microscopy

Optical microscopy

Near field optics

Microscopy

Applied physics

Photonic crystals

Nanolithography

Back to Top