Integrated infrared detectors and readout circuits

John W. Cairns; Louise Buckle; Graham J Pryce; Janet E. Hails; Jean Giess; Mark A. Crouch; David J. Hall; Alan Hydes; Andrew Graham; Andrew J. Wright; Colin J. Hollier; David J. Lees; Neil T. Gordon; Timothy Ashley

doi:10.1117/12.674017

17 May 2006 Integrated infrared detectors and readout circuits

John W. Cairns, Louise Buckle, Graham J Pryce, Janet E. Hails, Jean Giess, Mark A. Crouch, David J. Hall, Alan Hydes, Andrew Graham, Andrew J. Wright, Colin J. Hollier, David J. Lees, Neil T. Gordon, Timothy Ashley

Author Affiliations +

Proceedings Volume 6206, Infrared Technology and Applications XXXII; 620614 (2006) https://doi.org/10.1117/12.674017
Event: Defense and Security Symposium, 2006, Orlando (Kissimmee), Florida, United States

Abstract

The standard process for manufacturing mercury cadmium telluride (MCT) infrared focal plane arrays (FPAs) involves hybridising detectors onto a readout integrated circuit (ROIC). Wafer scale processing is used to fabricate both the detector arrays and the ROICs. The detectors are usually made by growing epitaxial MCT on to a suitable substrate, which is then diced and hybridised on to the ROIC. It is this hybridisation process that prevents true wafer scale production; if the MCT could be grown directly onto the ROIC, then wafer scale production of infrared FPAs could be achieved. In order to achieve this, a ROIC compatible with the growth process needs to be designed and fabricated and the growth and processing procedures modified to ensure survival of the ROIC. Medium waveband IR detector test structures have been fabricated with resistance area product of around 3x10⁴ Ω cm² at 77K. This is background limited in f/2 and demonstrates that wafer scale production is achievable.

Citation Download Citation

John W. Cairns, Louise Buckle, Graham J Pryce, Janet E. Hails, Jean Giess, Mark A. Crouch, David J. Hall, Alan Hydes, Andrew Graham, Andrew J. Wright, Colin J. Hollier, David J. Lees, Neil T. Gordon, and Timothy Ashley "Integrated infrared detectors and readout circuits", Proc. SPIE 6206, Infrared Technology and Applications XXXII, 620614 (17 May 2006); https://doi.org/10.1117/12.674017

ACCESS THE FULL ARTICLE

INSTITUTIONAL
Select your institution to access the SPIE Digital Library.

SELECT YOUR INSTITUTION

PERSONAL
Sign in with your SPIE account to access your personal subscriptions or to use specific features such as save to my library, sign up for alerts, save searches, etc.

PERSONAL SIGN IN

No SPIE Account? Create one

PURCHASE THIS CONTENT

SUBSCRIBE TO DIGITAL LIBRARY

50 downloads per 1-year subscription

Members: $195

Non-members: $335 ADD TO CART

25 downloads per 1 - year subscription

Members: $145

Non-members: $250 ADD TO CART

PURCHASE SINGLE ARTICLE

Includes PDF, HTML & Video, when available