Paper
21 September 2007 Optical module HEW simulations for the X-ray telescopes SIMBOL-X, EDGE and XEUS
Author Affiliations +
Abstract
One of the most important parameters defining the angular resolution of an X-ray optical module is its Half-Energy Width (HEW) as a function of the photon energy. Future X-ray telescopes with imaging capabilities (SIMBOL-X, Constellation-X, NeXT, EDGE, XEUS,...) should be characterized by a very good angular resolution in soft (< 10 keV) and hard (> 10 keV) X-rays. As a consequence, an important point in the optics development for these telescopes is the simulation of the achievable HEW for a system of X-ray mirrors. This parameter depends on the single mirror profile and nesting accuracy, but also on the mirrors surface microroughness that causes X-ray Scattering (XRS). In particular, owing to its dependence on the photon energy, XRS can dominate the profile errors in hard X-rays: thus, its impact has to be accurately evaluated in every single case, in order to formulate surface finishing requirements for X-ray mirrors. In this work we provide with some simulations of the XRS term of the HEW for some future soft and hard X-ray telescopes.
© (2007) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
D. Spiga "Optical module HEW simulations for the X-ray telescopes SIMBOL-X, EDGE and XEUS", Proc. SPIE 6688, Optics for EUV, X-Ray, and Gamma-Ray Astronomy III, 66880K (21 September 2007); https://doi.org/10.1117/12.734854
Lens.org Logo
CITATIONS
Cited by 3 scholarly publications.
Advertisement
Advertisement
RIGHTS & PERMISSIONS
Get copyright permission  Get copyright permission on Copyright Marketplace
KEYWORDS
Mirrors

X-rays

X-ray telescopes

X-ray optics

Scattering

Silicon

Spatial resolution

RELATED CONTENT

Aberration-free silicon pore x-ray optics
Proceedings of SPIE (September 26 2013)
On the optical design of a large X ray mirror...
Proceedings of SPIE (August 23 2021)
Realization and drive tests of active thin glass x ray...
Proceedings of SPIE (October 27 2016)
X-Ray Test Facilities At Max-Planck-Institut Garching
Proceedings of SPIE (August 09 1979)

Back to Top