Paper
4 September 2008 Application of the dual energy technique by using a photon counting CdTe detector
Wenjuan Zou, Takuya Nakashima, Yoshiaki Onishi, Hisashi Morii, Yoichiro Neo, Hidenori Mimura, Toru Aoki
Author Affiliations +
Abstract
We have proposed a new system for X-ray computed tomography (CT) scanning. By employing the dual-energy measurement, the obtained data can be used to deduce distribution images of the atomic number and electron density which are useful for identifying the scanned material. In this work, two different methods were given for the derivative process. We found method A was suitable for measuring low-Z materials while method B worked well for high-Z materials. Therefore, the two derivative methods may work complementally for material identification.
© (2008) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Wenjuan Zou, Takuya Nakashima, Yoshiaki Onishi, Hisashi Morii, Yoichiro Neo, Hidenori Mimura, and Toru Aoki "Application of the dual energy technique by using a photon counting CdTe detector", Proc. SPIE 7079, Hard X-Ray, Gamma-Ray, and Neutron Detector Physics X, 70790I (4 September 2008); https://doi.org/10.1117/12.794634
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KEYWORDS
Signal attenuation

Sensors

X-rays

Nickel

X-ray computed tomography

Photon counting

Calibration

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