Dr. Wenjuan Zou
at Shizuoka Univ
SPIE Involvement:
Author
Publications (1)

Proceedings Article | 4 September 2008 Paper
Wenjuan Zou, Takuya Nakashima, Yoshiaki Onishi, Hisashi Morii, Yoichiro Neo, Hidenori Mimura, Toru Aoki
Proceedings Volume 7079, 70790I (2008) https://doi.org/10.1117/12.794634
KEYWORDS: Signal attenuation, Sensors, X-rays, X-ray computed tomography, Nickel, Photon counting, Scattering, Calibration, Dual energy imaging, X-ray detectors

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