Measuring a laser focal spot on a large intensity range: effect of optical component laser damages on the focal spot

Stéphane Bouillet; Sandrine Chico; Laurent Le Deroff; Gérard Razé; Roger Courchinoux

doi:10.1117/12.827962

24 August 2009 Measuring a laser focal spot on a large intensity range: effect of optical component laser damages on the focal spot

Stéphane Bouillet, Sandrine Chico, Laurent Le Deroff, Gérard Razé, Roger Courchinoux

Author Affiliations +

Proceedings Volume 7405, Instrumentation, Metrology, and Standards for Nanomanufacturing III; 74050W (2009) https://doi.org/10.1117/12.827962
Event: SPIE NanoScience + Engineering, 2009, San Diego, California, United States

Abstract

LIL and LMJ are two French high power lasers dedicated to fusion and plasma experiments. Mastering the characteristics of the focal spots focused on the targets during the experiments is very important. In order to analyze the focal spots in its high power lasers, the CEA has developed an independent set-up that enables to measure energy spatial profiles over a 5 decade dynamic range by the means of several acquisitions taken at different power levels. The different data sets are then stitched to obtain a high dynamic picture of the beam. The experiment can also be used as a photometer enabling to measure the energy transmitted by an optical component. We used this set-up to study the effect of different parameters on the energy spatial profile of the focal spots. We have measured the effect of laser damages (on the optical components of the beam) on the energy scattered around the main focal spot. We also demonstrated that the level of this scattered power can be calculated from a near-field picture of the beam or even with pictures of the damaged components taken with an appropriate lighting.

Citation Download Citation

Stéphane Bouillet, Sandrine Chico, Laurent Le Deroff, Gérard Razé, and Roger Courchinoux "Measuring a laser focal spot on a large intensity range: effect of optical component laser damages on the focal spot", Proc. SPIE 7405, Instrumentation, Metrology, and Standards for Nanomanufacturing III, 74050W (24 August 2009); https://doi.org/10.1117/12.827962

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