SNR analysis according to the practical factors for Mie-scattering lidar

Zongjia Qiu; Siying Chen; Yinchao Zhang; Tian Lan; Yuzhao Wang; Weiguo Kong; Peng Liu; Guoqiang Ni

doi:10.1117/12.838220

20 November 2009 SNR analysis according to the practical factors for Mie-scattering lidar

Zongjia Qiu, Siying Chen, Yinchao Zhang, Tian Lan, Yuzhao Wang, Weiguo Kong, Peng Liu, Guoqiang Ni

Proceedings Volume 7511, 2009 International Conference on Optical Instruments and Technology: Optoelectronic Measurement Technology and Systems; 751123 (2009) https://doi.org/10.1117/12.838220
Event: International Conference on Optical Instrumentation and Technology, 2009, Shanghai, China

Abstract

The effectiveness of the lidar scattering signal can be intuitively reflected by SNR. Thus the effective detection range can be objectively evaluated. Usually by theoretical analyzing the devices of lidar signal detection system, an ideal SNR model of scattering signal can be built. Under these circumstances the theoretical SNR might be an inflated value. For instance, when the detection distance is 20Km the SNR can be up to 20dB. However, in the practical experiment the 10Km's SNR is merely 3dB. From the results, it can be deduced that the effective distance range is far less than the simulation value. Consequently, other practical factors must be considered in SNR analysis for Mie-scattering lidar. In the paper the results of Mie scattering lidar experiment are shown firstly. Then the SNR is calculated through deducting the background noise. The background radiation specific gravity is also presented in this paper. The photomultiplier tubes dark-current is detected. And the effect of all noise components to the SNR is estimated. Meanwhile, some improve measurements to reduce the interference noise are mentioned.

Citation Download Citation

Zongjia Qiu, Siying Chen, Yinchao Zhang, Tian Lan, Yuzhao Wang, Weiguo Kong, Peng Liu, and Guoqiang Ni "SNR analysis according to the practical factors for Mie-scattering lidar", Proc. SPIE 7511, 2009 International Conference on Optical Instruments and Technology: Optoelectronic Measurement Technology and Systems, 751123 (20 November 2009); https://doi.org/10.1117/12.838220

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