Noise-reduction in fringe patterns based on the empirical mode decomposition

Wei-Hung Su; Chao-Kuei Lee; Chen-Wei Lee

doi:10.1117/12.841515

8 February 2010 Noise-reduction in fringe patterns based on the empirical mode decomposition

Wei-Hung Su, Chao-Kuei Lee, Chen-Wei Lee

Proceedings Volume 7613, Complex Light and Optical Forces IV; 76130V (2010) https://doi.org/10.1117/12.841515
Event: SPIE OPTO, 2010, San Francisco, California, United States

Abstract

Phase-extraction from fringe patterns is an inevitable procedure in many applications, such as interferometry, Moiré analysis, and profilometry using structured light illumination. Errors to phase-extraction always occur when the signal-to- noise ratio is weak. In this paper, we use the empirical mode decomposition (EMD) with a generalized analysis model to reduce the white noise from a fringe pattern. It is found that phases can be extracted with high accuracy once noise-reduction is performed with this model.

Citation Download Citation

Wei-Hung Su, Chao-Kuei Lee, and Chen-Wei Lee "Noise-reduction in fringe patterns based on the empirical mode decomposition", Proc. SPIE 7613, Complex Light and Optical Forces IV, 76130V (8 February 2010); https://doi.org/10.1117/12.841515

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