Prof. Wei-Hung Su Profile

Prof. Wei-Hung Su

Associate Professor at National Sun Yat-sen Univ

SPIE Involvement:

Conference Program Committee | Author

Publications (66)

Proceedings Article | 5 October 2023 Poster + Paper

Phase-shifting projected fringe profilometry using the pulsed phase-encoding algorithm

Ching-Cherng Sun, Yeh-Wei Yu, Wei-Hung Su

Proceedings Volume 12682, 126820C (2023) https://doi.org/10.1117/12.2677321

KEYWORDS: Phase shifts, Phase unwrapping, Fringe analysis, Inspection, Projection systems, Calibration, Point spread functions

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Proceedings Article | 5 October 2023 Poster + Paper

3D profile measurements using 2D fringe projections in the tele-centric system

Wei-Hung Su, Zhi-Hsiang Liu

Proceedings Volume 12682, 126820B (2023) https://doi.org/10.1117/12.2677320

KEYWORDS: Fringe analysis, Inspection, Phase unwrapping, Phase shifts, 3D metrology, Fourier transforms, Phase distribution, 3D projection, Reflectivity, Image sensors

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Proceedings Article | 5 October 2023 Poster + Paper

3D profile measurements by coaxial fringe projections and image acquisitions

Nai-Jen Cheng, Hsin-Jen Hsu, Wei-Hung Su

Proceedings Volume 12682, 126820D (2023) https://doi.org/10.1117/12.2677325

KEYWORDS: Inspection, 3D projection, Fringe analysis, Image acquisition, 3D metrology, 3D acquisition, 3D image processing, Amplitude modulation, Discontinuities

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Proceedings Article | 5 October 2023 Poster + Paper

Error-controlled decoding in phase unwrapping for phase-shifting projected fringe profilometry

Wei-Hung Su, Pei-Chi Li, Sih-Yue Chen

Proceedings Volume 12682, 126820A (2023) https://doi.org/10.1117/12.2677314

KEYWORDS: Phase unwrapping, Phase shifts, Fringe analysis, Discontinuities, Inspection, Phase distribution, 3D projection, Signal to noise ratio, 3D metrology, Surface roughness

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Proceedings Article | 3 October 2022 Presentation + Paper

Phase-shifting projected fringe profilometry by binary-encoded projections

Wei-Hung Su, Nai-Jen Cheng

Proceedings Volume 12229, 1222909 (2022) https://doi.org/10.1117/12.2632370

KEYWORDS: Phase shifts, Binary data, Fringe analysis, Inspection, Reflectivity, Projection systems, Imaging arrays, Image sensors, Calibration, 3D metrology

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Proceedings Article | 20 August 2020 Poster + Paper

Design of 2D fringe pattern for tele-centric Fourier transform profilometry

Wei-Hung Su, Zhi-Hsiang Liu

Proceedings Volume 11498, 114980V (2020) https://doi.org/10.1117/12.2572294

KEYWORDS: Fringe analysis, Fourier transforms, Inspection, Projection systems, 3D metrology, Reflectivity, Image acquisition

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Proceedings Article | 20 August 2020 Poster + Paper

Pulsed-encoded pattern projections for phase-shifting projected fringe profilometry

Wei-Hung Su, Sih-Yue Chen

Proceedings Volume 11498, 114980W (2020) https://doi.org/10.1117/12.2572295

KEYWORDS: Phase shifts, Fringe analysis, Inspection, 3D metrology, Calibration, Projection systems

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Proceedings Article | 20 August 2020 Poster + Paper

One-shot profile measurements for a rotating object using Fourier transform profilometry

Wei-Hung Su, Huai-Syuan Huang, Nai-Jen Cheng

Proceedings Volume 11498, 114980X (2020) https://doi.org/10.1117/12.2572296

KEYWORDS: Fourier transforms, Inspection, Fringe analysis, Image sensors, 3D metrology

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Proceedings Article | 9 September 2019 Paper

Deformation measurements using a stereo microscope

Wei-Hung Su, Yu-Heng Lo

Proceedings Volume 11123, 111230T (2019) https://doi.org/10.1117/12.2530711

KEYWORDS: Inspection, Microscopes, Fringe analysis, 3D metrology, Projection systems, Image sensors, CCD cameras, Imaging arrays, Modulation, Fourier transforms

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Proceedings Article | 9 September 2019 Paper

Fourier-transform profilometry using a pulse-encoded fringe pattern

Wei-Hung Su, Zhi-Hsiang Liu

Proceedings Volume 11123, 111230V (2019) https://doi.org/10.1117/12.2530715

KEYWORDS: Fringe analysis, Inspection, Fourier transforms, Image transmission, Bandpass filters, Reflectivity, 3D metrology, Image sensors, Imaging arrays, Optoelectronics

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Proceedings Article | 9 September 2019 Paper

Mask optimization for 1D scanning projected fringe profilometry

Nai-Jen Cheng, Chia-Yu Hsu, Yi-An Lin, Wei-Hung Su

Proceedings Volume 11123, 111230W (2019) https://doi.org/10.1117/12.2530716

KEYWORDS: Inspection, Source mask optimization, CCD cameras, Reflectivity, Image sensors, Imaging arrays, 3D metrology, Fringe analysis, Modulation, Image filtering

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Proceedings Article | 9 September 2019 Paper

Profile measurements using contrast-encoded pattern projections

Nai-Jen Cheng, Sih-Yue Chen, Wei-Hung Su

Proceedings Volume 11123, 111230U (2019) https://doi.org/10.1117/12.2530714

KEYWORDS: Phase shifts, Fringe analysis, 3D metrology, Inspection, Phase measurement, Adaptive optics, Bromine, Calibration, Projection systems, CCD cameras

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Proceedings Article | 4 September 2018 Paper

One shot projected fringe profilometry using a 2D fringe-encoded pattern

Wei-Hung Su, Sih-Yue Chen

Proceedings Volume 10755, 1075511 (2018) https://doi.org/10.1117/12.2323809

KEYWORDS: Inspection, Fringe analysis, 3D metrology, Fourier transforms, Cameras, Projection systems, CCD cameras, Optoelectronics, Sun, Reflectivity

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Proceedings Article | 4 September 2018 Paper

3D shape measurements using phase-encoded patterns and phase-shifting techniques

Ching-Cherng Sun, Yeh-Wei Yu, Wei-Hung Su

Proceedings Volume 10755, 1075512 (2018) https://doi.org/10.1117/12.2323813

KEYWORDS: Phase shifts, 3D metrology, Binary data, Fringe analysis, Inspection, Phase measurement, Sun, Image sensors, Imaging arrays, Detection and tracking algorithms

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Proceedings Article | 4 September 2018 Paper

Profile measurements for specular objects using binary-encoded patterns

Wei-Hung Su, Sih-Yue Chen

Proceedings Volume 10755, 1075513 (2018) https://doi.org/10.1117/12.2323815

KEYWORDS: Fringe analysis, Inspection, Mirrors, Binary data, CCD cameras, Calibration, 3D metrology, Robotics, Metals, Transmittance

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Proceedings Article | 4 September 2018 Paper

3D image retrieval based on 1D scanning fringe projections

Nai-Jen Cheng, Chia-Yu Hsu, Yi-An Lin, Wei-Hung Su

Proceedings Volume 10755, 1075514 (2018) https://doi.org/10.1117/12.2323817

KEYWORDS: Inspection, 3D image processing, 3D metrology, CCD cameras, Image retrieval, Image filtering, Bandpass filters, Fringe analysis, Cameras, Halogens

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Proceedings Article | 23 August 2017 Presentation + Paper

Mathematical expressions using fringe projections for transparent objects

Wei-Hung Su, Chau-Jern Cheng

Proceedings Volume 10382, 103820M (2017) https://doi.org/10.1117/12.2275326

KEYWORDS: Fringe analysis, 3D metrology, Ray tracing, Optical inspection, CCD cameras, Refractive index, 3D image processing, Shape analysis, Photonic devices

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Proceedings Article | 23 August 2017 Presentation + Paper

Phase-shifting projected fringe profilometry using ternary-encoded patterns

Sih-Yue Chen, Nai-Jen Cheng, Wei-Hung Su

Proceedings Volume 10382, 103820U (2017) https://doi.org/10.1117/12.2275325

KEYWORDS: Fringe analysis, Phase shifts, Optical inspection, Data processing, Reliability, Photonic devices

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Proceedings Article | 23 August 2017 Presentation + Paper

One shot profile measurements using a binary-encoded pattern

Wei-Hung Su, Sih-Yue Chen

Proceedings Volume 10382, 103820T (2017) https://doi.org/10.1117/12.2275322

KEYWORDS: Fringe analysis, Reflectivity, Optical inspection, Inspection, Cameras, Photonic devices

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Proceedings Article | 23 August 2017 Presentation + Paper

A scanning approach using a binary grid pattern for 3D shape measurements

Nai-Jen Cheng, Wei-Hung Su

Proceedings Volume 10382, 103820N (2017) https://doi.org/10.1117/12.2275327

KEYWORDS: 3D metrology, Binary data, 3D surface sensing, Optical sensing, Optical inspection, Projection systems, Inspection, Photonic devices

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Proceedings Article | 7 September 2016 Paper

Phase unwrapping using binary-encoded fringe pattern for phase-shifting projected fringe profilometry

Nai-Jeng Cheng, Sih-Yue Chen, Wei-Hung Su

Proceedings Volume 9958, 995819 (2016) https://doi.org/10.1117/12.2240067

KEYWORDS: Fringe analysis, Phase shifts, Computer programming, Reflectivity, Binary data, Inspection, Transmittance, 3D metrology, Time metrology, Photonic crystal fibers

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Proceedings Article | 7 September 2016 Paper

Fabrication of holographic materials by photo-induced polymers

Shiao-Wei Kuo, Sheng-Kai Juang, Hao-Yu Tsai, Wei-Hung Su

Proceedings Volume 9958, 99581C (2016) https://doi.org/10.1117/12.2240070

KEYWORDS: Holography, Holograms, Composites, Diffraction, Holographic materials, Polymers, Polymethylmethacrylate, Diffraction gratings, 3D image reconstruction, Optical storage

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Proceedings Article | 7 September 2016 Paper

Scanning fringe projection for 3D shape measurements

Nai-Jen Cheng, Wei-Hung Su

Proceedings Volume 9958, 99581B (2016) https://doi.org/10.1117/12.2240069

KEYWORDS: 3D metrology, 3D image processing, Image processing, Inspection, CCD cameras, Bandpass filters, Fringe analysis, Fourier transforms, Beam splitters, Light sources

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Proceedings Article | 7 September 2016 Paper

A 3D translation stage calibrated with Michelson interferometers

Hui-Hung Lin, Kuo-Kai Hung, Lu-Yu Wang, Wei-Hung Su

Proceedings Volume 9958, 99581A (2016) https://doi.org/10.1117/12.2240068

KEYWORDS: 3D metrology, Michelson interferometers, Mirrors, Beam splitters, Phase shifts, Calibration, Fourier transforms, Lithography, Interferometry, Distance measurement

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Proceedings Article | 8 September 2015 Paper

Projected fringe profilometry for metal surfaces

Wei-Hung Su, Bo-Chin Huang

Proceedings Volume 9586, 95861G (2015) https://doi.org/10.1117/12.2190220

KEYWORDS: Metals, Fringe analysis, Inspection, CCD cameras, Mirrors, Calibration, Image sensors, Fourier transforms, 3D metrology, Imaging arrays

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Proceedings Article | 26 August 2015 Paper

A reliable image processing algorithm using the scanning fringe projection for 3D profile measurements

Nai-Jen Cheng, Wei-Hung Su

Proceedings Volume 9586, 95861I (2015) https://doi.org/10.1117/12.2190222

KEYWORDS: Inspection, 3D metrology, 3D image processing, Fringe analysis, CCD cameras, Image processing, Cameras, Beam splitters, Image filtering, 3D image enhancement

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Proceedings Article | 26 August 2015 Paper

Three-dimensional shape measurements using endoscopes

Wei-Hung Su, Tzu-Chien Hsu, Cho-Yo Kuo

Proceedings Volume 9586, 95861H (2015) https://doi.org/10.1117/12.2190221

KEYWORDS: Holograms, Endoscopes, Inspection, Volume holography, Fringe analysis, Silica, Holography, Diffraction, CCD cameras, Beam splitters

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Proceedings Article | 26 August 2015 Paper

Gray-level encoded fringe projection for profile measurements

Wei-Hung Su, Bo-Chin Huang

Proceedings Volume 9586, 95861F (2015) https://doi.org/10.1117/12.2190215

KEYWORDS: Binary data, Fourier transforms, Inspection, Computer programming, Reflectivity, Fringe analysis, 3D metrology, Transmittance, Image filtering, Tolerancing

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Proceedings Article | 5 September 2014 Paper

A scanning approach using fringe projection techniques for 3D profile measurements

Nai-Jen Cheng, Wei-Hung Su, Yung-Chi Chen

Proceedings Volume 9200, 92001K (2014) https://doi.org/10.1117/12.2064308

KEYWORDS: 3D metrology, Inspection, CCD cameras, Fringe analysis, Cameras, 3D image processing, Fourier transforms, Light sources, Beam splitters, Photonic crystal fibers

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Proceedings Article | 5 September 2014 Paper

Projected fringe profilometry for non-diffusive objects

Wei-Hung Su, Nai-Jen Cheng

Proceedings Volume 9200, 92001I (2014) https://doi.org/10.1117/12.2064306

KEYWORDS: Holograms, Fringe analysis, Inspection, Glasses, 3D metrology, CCD cameras, Reflection, Mirrors, Projection devices, Holography

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Proceedings Article | 5 September 2014 Paper

Design of the binary-encoded fringe pattern for projected fringe profilometr

Wei-Hung Su

Proceedings Volume 9200, 92001H (2014) https://doi.org/10.1117/12.2064305

KEYWORDS: Fringe analysis, Binary data, Transmittance, Inspection, Fourier transforms, 3D metrology, Lithography, Fabrication, Tolerancing, Projection systems

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Proceedings Article | 5 September 2014 Paper

3D shape measurements for plano-convex lenses using fringe projection techniques

Wei-Hung Su, Chau-Jern Cheng, Yi-Ta Lee

Proceedings Volume 9200, 92001J (2014) https://doi.org/10.1117/12.2064307

KEYWORDS: Inspection, 3D metrology, Fringe analysis, CCD cameras, Shape analysis, Refractive index, 3D image processing, Lenses, Fourier transforms, Light sources

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Proceedings Article | 25 September 2013 Paper

Design of the optical concentrator using holographic techniques for solar cells

Wei-Hung Su, Bae-Heng Tseng, Wei-Ting Chen

Proceedings Volume 8847, 88470K (2013) https://doi.org/10.1117/12.2025380

KEYWORDS: Holograms, Solar cells, Solar concentrators, Diffraction, Lenticular lenses, Holography, Optical design, Reflectivity, Solar energy, Spherical lenses

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Proceedings Article | 25 September 2013 Paper

3D shape measurements for non-diffusive objects using fringe projection techniques

Wei-Hung Su, Bae-Heng Tseng, Nai-Jen Cheng

Proceedings Volume 8847, 88471K (2013) https://doi.org/10.1117/12.2025418

KEYWORDS: 3D metrology, Holograms, Inspection, Fringe analysis, Glasses, CCD cameras, Reflection, Holography, Image acquisition, Mirrors

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Proceedings Article | 25 September 2013 Paper

Using a projected fringe pattern to identify the focused image and its application to 3D shape measurements

Nai-Jen Cheng, Wei-Hung Su

Proceedings Volume 8847, 88471L (2013) https://doi.org/10.1117/12.2025421

KEYWORDS: 3D metrology, Inspection, Fringe analysis, 3D image processing, CCD cameras, Cameras, 3D applications, Fourier transforms, Photonic crystal fibers, Sensors

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Proceedings Article | 15 October 2012 Paper

Speckle reduction for fringe patterns using a database system based on the empirical mode decomposition

Wei-Hung Su, Chen-Wei Lee, Chao-Kuei Lee

Proceedings Volume 8497, 84970M (2012) https://doi.org/10.1117/12.930603

KEYWORDS: Speckle, Fringe analysis, Databases, Signal to noise ratio, Speckle pattern, Interference (communication), Sun, Optimization (mathematics), Fourier transforms, Wavelets

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Proceedings Article | 15 October 2012 Paper

Image registration with fringe projection techniques: a simple approach to form a high-resolution image from multiple low-resolution images

Wei-Hung Su, Chao-Kuei Lee, Jhao-yu Zeng , Yu-Ting Yao

Proceedings Volume 8497, 849714 (2012) https://doi.org/10.1117/12.930606

KEYWORDS: Image registration, Image enhancement, Image resolution, Cameras, CCD cameras, Resolution enhancement technologies, Phase shifts, Fringe analysis, Sun, Image processing

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Proceedings Article | 15 October 2012 Paper

Deformation measurements using projected fringe profilometry

Wei-Hung Su, Wei-Ting Co

Proceedings Volume 8497, 849713 (2012) https://doi.org/10.1117/12.930602

KEYWORDS: Inspection, Fringe analysis, CCD cameras, Data processing, Environmental sensing, Image sensors, Modulation, Three dimensional sensing, Projection systems, Image acquisition

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Proceedings Article | 8 September 2011 Paper

Trace and profile measurements for dynamic objects

Wei-Hung Su, Cho-Yo Kuo

Proceedings Volume 8120, 812011 (2011) https://doi.org/10.1117/12.892727

KEYWORDS: Fringe analysis, Inspection, 3D metrology, Fourier transforms, Lamps, CCD cameras, Binary data, 3D image processing, Evolutionary algorithms, Video

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Proceedings Article | 8 September 2011 Paper

Speckle-reduction for fringe patterns using the 1D empirical mode decomposition

Wei-Hung Su, Chao-Kuei Lee, Cheng-Wei Lee

Proceedings Volume 8120, 812012 (2011) https://doi.org/10.1117/12.892733

KEYWORDS: Speckle, Fringe analysis, Databases, Signal generators, Speckle pattern, CCD cameras, Signal to noise ratio, Light sources, Pixel resolution, Michelson interferometers

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Proceedings Article | 8 September 2011 Paper

Color retrieval for fringe projection techniques

Wei-Hung Su

Proceedings Volume 8120, 81200Q (2011) https://doi.org/10.1117/12.892730

KEYWORDS: Bandpass filters, 3D image enhancement, Inspection, 3D vision, Image filtering, Enhanced vision, 3D image processing, Image enhancement, Fringe analysis, CCD cameras

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Proceedings Article | 8 September 2011 Paper

Real-time profilometry using double fringe projection techniques: a compact design for endoscopes

Wei-Hung Su, Chieng-Feng Hung, Wei-Chia Su

Proceedings Volume 8120, 812013 (2011) https://doi.org/10.1117/12.892740

KEYWORDS: Inspection, Fringe analysis, Endoscopes, 3D metrology, Holograms, Binary data, Projection systems, Objectives, CCD cameras, Diffraction

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Proceedings Article | 18 August 2010 Paper

3D shape sensing using a phase mask to extend the depth measuring range

Wei-Hung Su, Chun-Hsiang Hsu

Proceedings Volume 7781, 77810Q (2010) https://doi.org/10.1117/12.859768

KEYWORDS: Microscopes, Sensing systems, Image acquisition, Phase shift keying, Fourier transforms, Optical transfer functions, Inspection, 3D surface sensing, 3D acquisition, Projection systems

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Proceedings Article | 18 August 2010 Paper

Profile measurements for images blurred by motion

Wei-Hung Su

Proceedings Volume 7781, 77810N (2010) https://doi.org/10.1117/12.859763

KEYWORDS: 3D metrology, Fringe analysis, Motion measurement, CCD cameras, 3D image processing, Inspection, Image sensors, Imaging arrays, Modulation, Photonic crystal fibers

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Proceedings Article | 18 August 2010 Paper

Speed sensing using projected fringe profilometry

Wei-Hung Su

Proceedings Volume 7781, 77810O (2010) https://doi.org/10.1117/12.859765

KEYWORDS: Fringe analysis, CCD cameras, 3D metrology, Data processing, Environmental sensing, Inspection, Image sensors, Modulation, Image analysis, Motion measurement

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Proceedings Article | 18 August 2010 Paper

A database system using the empirical mode decomposition to smooth subjective speckles in fringe patterns

Wei-Hung Su, Chao-Kuei Lee, Cheng-Wei Lee

Proceedings Volume 7781, 77810P (2010) https://doi.org/10.1117/12.859767

KEYWORDS: Databases, Fringe analysis, Signal generators, Speckle, Computer simulations, Signal to noise ratio, Phase shifts, Image filtering, Light sources, Inspection

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Proceedings Article | 8 February 2010 Paper

Noise-reduction in fringe patterns based on the empirical mode decomposition

Wei-Hung Su, Chao-Kuei Lee, Chen-Wei Lee

Proceedings Volume 7613, 76130V (2010) https://doi.org/10.1117/12.841515

KEYWORDS: Signal to noise ratio, Fringe analysis, Interference (communication), Image processing, Statistical analysis, Interferometry, Denoising, Computer simulations, Inspection, Electronic filtering

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SPIE Journal Paper | 1 July 2009 Open Access

Three-dimensional shape reconstruction from images blurred by motion

Wei-Hung Su, Chao-Kuei Lee

OE, Vol. 48, Issue 07, 073604, (July 2009) https://doi.org/10.1117/12.10.1117/1.3180865

KEYWORDS: 3D image processing, Inspection, 3D image reconstruction, Fringe analysis, Optical engineering, CCD cameras, Motion measurement, Fourier transforms, 3D metrology, Image sensors

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Proceedings Article | 25 August 2008 Paper

Speckles removal from interference patterns illuminated by coherent light using empirical mode decomposition

Wei-Hung Su, Chao-Kuei Lee, Cheng-Wei Lee

Proceedings Volume 7056, 70561Q (2008) https://doi.org/10.1117/12.796697

KEYWORDS: Speckle, Fringe analysis, Signal to noise ratio, Light sources, Phase shifts, Interference (communication), Data modeling, Signal processing, Optical metrology, Optical microscopy

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Proceedings Article | 25 August 2008 Paper

Projected fringe profilometry using a holographic technique: a compact design for endoscopes

Wei-Hung Su, Chi-Hung Shao

Proceedings Volume 7056, 70561R (2008) https://doi.org/10.1117/12.796700

KEYWORDS: Endoscopes, 3D metrology, Diffraction, Inspection, Projection systems, Holograms, Objectives, Holography, Image acquisition, Fringe analysis

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Proceedings Article | 25 August 2008 Paper

Projected fringe profilometry using the area-encoded algorithm for dynamic and complex objects

Wei-Hung Su

Proceedings Volume 7056, 70561X (2008) https://doi.org/10.1117/12.796691

KEYWORDS: 3D metrology, Binary data, Fringe analysis, Inspection, Fourier transforms, Computer programming, Calibration, Transmittance, CCD cameras, Phase measurement

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Proceedings Article | 25 August 2008 Paper

A 3D shape sensing system using multiple fringe projections from different partial views to form an entire shape

Wei-Hung Su, Chun-Chieh Wang, Chung-Fan Tu

Proceedings Volume 7056, 70561P (2008) https://doi.org/10.1117/12.796695

KEYWORDS: Calibration, Image segmentation, Sensing systems, Image registration, Inspection, 3D metrology, Sensors, Data fusion, Three dimensional sensing, CCD cameras

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Proceedings Article | 17 September 2007 Paper

3D shape reconstruction using multiple projections: a method to eliminate shadowing for projected fringe profilometry

Wei-Hung Su, Cho-Yo Kuo

Proceedings Volume 6698, 669811 (2007) https://doi.org/10.1117/12.738699

KEYWORDS: Calibration, Fringe analysis, Fourier transforms, Inspection, Projection systems, 3D metrology, CCD cameras, Shape analysis, Phase shifts, Computer programming

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Proceedings Article | 17 September 2007 Paper

Time resolved profile measurements for ultra-fast vibrating objects

Wei-Hung Su, Cho-Yo Kuo

Proceedings Volume 6698, 66980W (2007) https://doi.org/10.1117/12.738701

KEYWORDS: Binary data, Fringe analysis, CCD cameras, 3D metrology, Fourier transforms, Inspection, Image sensors, Phase shifts, Video, Sensors

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Proceedings Article | 17 September 2007 Paper

Speckles removal from 3D images by empirical mode decomposition

Wei-Hung Su, Guan-Long Chen, Cho-Yo Kuo

Proceedings Volume 6698, 66980K (2007) https://doi.org/10.1117/12.738702

KEYWORDS: Signal to noise ratio, 3D image processing, Speckle, 3D image reconstruction, Linear filtering, Light sources, Interference (communication), 3D acquisition, Optical interferometry, Photonic crystal fibers

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Proceedings Article | 17 September 2007 Paper

3D shape reconstruction using projected fringe profilometry for an image blurred by linear motion

Cho-Yo Kuo, Chao-Kuei Lee, Wei-Hung Su

Proceedings Volume 6698, 669812 (2007) https://doi.org/10.1117/12.738703

KEYWORDS: 3D metrology, 3D image reconstruction, 3D image processing, Calibration, Fringe analysis, Fourier transforms, Phase measurement, Inspection, Projection systems, Shape analysis

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Proceedings Article | 24 August 2006 Paper

Projected fringe profilometry using a supercontinum light illumination for micro-scale measurements

Wei-Hung Su, Chia-Jeng Huang

Proceedings Volume 6314, 63141D (2006) https://doi.org/10.1117/12.679505

KEYWORDS: Calibration, Photonic crystal fibers, Light, Light sources, Speckle, Fringe analysis, Fiber lasers, Nonlinear crystals, 3D metrology, Projection systems

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Proceedings Article | 24 August 2006 Paper

Projected fringe profilometry using a hologram for objects with large depth discontinuities

Wei-Hung Su, Wei-Jen Chen, Jun-Shan Huang, Cho-Yo Kuo

Proceedings Volume 6314, 63140P (2006) https://doi.org/10.1117/12.679529

KEYWORDS: Fringe analysis, Holograms, 3D metrology, Transmittance, Inspection, Palladium, Fourier transforms, Calibration, Distortion, Diffraction

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Proceedings Article | 8 September 2005 Paper

Projected fringe profilometry using holographic techniques for large-scale measurements

Wei-Hung Su, Wei-Jen Chen, Hung-Jei Kao, Chia-Jeng Huang

Proceedings Volume 5911, 59110Q (2005) https://doi.org/10.1117/12.618870

KEYWORDS: Calibration, Fringe analysis, Holography, Distortion, Holograms, Imaging systems, Projection systems, 3D metrology, Inspection, Optical calibration

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Proceedings Article | 8 September 2005 Paper

Integration of segmented 3D image data measured by projected fringe profilometry using supercontinuum light

Wei-Hung Su, Zhiwen Liu, Kebin Shi, Karl Reichard, Shizhuo Yin

Proceedings Volume 5911, 59110N (2005) https://doi.org/10.1117/12.618877

KEYWORDS: Image segmentation, 3D metrology, 3D image processing, Fluctuations and noise, Photonic crystal fibers, Fringe analysis, Nonlinear crystals, Light, Imaging systems, CCD cameras

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Proceedings Article | 11 January 2005 Paper

Design and fabrication of digital 2D fringe patterns and their application to accurate integration of segmented 3D image data

Wei-Hung Su, Hongyu Liu, Hung-Ming Chen, Cho-Yo Kuo, Yi-Ling Hsu

Proceedings Volume 5642, (2005) https://doi.org/10.1117/12.571397

KEYWORDS: Fringe analysis, Image segmentation, 3D image processing, Image registration, Transmittance, Phase shifts, Optical design, Digital imaging, 3D metrology, Inspection

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Proceedings Article | 16 December 2004 Paper

Design and fabrication of digital dual-frequency patterns for projected fringe profilometry

Wei-Hung Su, Yi-Ling Hsu, Cho-Yo Kuo, Hong-Ming Chen, Wei-Chen Su, Shizhuo Yin

Proceedings Volume 5606, (2004) https://doi.org/10.1117/12.569992

KEYWORDS: Fringe analysis, Transmittance, Phase shifts, Charge-coupled devices, Optical design, 3D metrology, Fabrication, Lithography, Imaging systems, Inspection

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Proceedings Article | 22 October 2004 Paper

Design and fabrication of various digital fringe patterns for projected fringe profilometry

Wei-Hung Su, Cho-Yo Kuo, Shizhuo Yin

Proceedings Volume 5560, (2004) https://doi.org/10.1117/12.559749

KEYWORDS: Fringe analysis, Transmittance, Phase shifts, Optical design, Charge-coupled devices, CCD cameras, Imaging systems, Lithography, 3D metrology, Lithium

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Proceedings Article | 22 October 2004 Paper

Integration of segmented 3D image data measured by projected fringe profilometry

Wei-Hung Su, Yi-Ling Hsu, Cho-Yo Kuo, Hung-Ming Chen

Proceedings Volume 5560, (2004) https://doi.org/10.1117/12.559779

KEYWORDS: Calibration, Image segmentation, Image registration, 3D metrology, 3D image processing, Phase shifts, Distortion, Imaging systems, Phase measurement, Data fusion

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Proceedings Article | 21 October 2003 Paper

A unique all-optic switch based on an innovatively designed liquid crystal waveguide

Sung-Hyun Nam, Wei-Hung Su, Jesus Chavez, Shizhuo Yin

Proceedings Volume 5206, (2003) https://doi.org/10.1117/12.513912

KEYWORDS: Waveguides, Switches, Refractive index, Liquid crystals, Mirrors, Switching, Polymers, Photomasks, Photonic integrated circuits, Electrodes

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SPIE Journal Paper | 1 June 2003

Fabrication of digital sinusoidal gratings and precisely controlled diffusive flats and their application to highly accurate projected fringe profilometry

Wei-Hung Su, Hongyu Liu, Karl Richard, Shizhuo Yin, Francis Yu

OE, Vol. 42, Issue 06, (June 2003) https://doi.org/10.1117/12.10.1117/1.1573217

KEYWORDS: Calibration, Phase measurement, Phase shifts, Optical design, Teeth, Transmittance, Optical engineering, Charge-coupled devices, Distortion, 3D metrology

Showing 5 of 66 publications

Conference Committee Involvement (10)

Photonic Fiber and Crystal Devices: Advances in Materials and Innovations in Device Applications XVIII

18 August 2024 | San Diego, California, United States

Photonic Fiber and Crystal Devices: Advances in Materials and Innovations in Device Applications XVII

20 August 2023 | San Diego, California, United States

Photonic Fiber and Crystal Devices: Advances in Materials and Innovations in Device Applications XVI

21 August 2022 | San Diego, California, United States

Photonic Fiber and Crystal Devices: Advances in Materials and Innovations in Device Applications XV

2 August 2021 | San Diego, California, United States

Photonic Fiber and Crystal Devices: Advances in Materials and Innovations in Device Applications XIV

24 August 2020 | Online Only, California, United States

Showing 5 of 10 Conference Committees

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