Paper
18 August 2010 3D shape sensing using a phase mask to extend the depth measuring range
Wei-Hung Su, Chun-Hsiang Hsu
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Abstract
An approach using a phase mask to enlarge the depth measuring range for a 3D shape sensing system is presented. A microscope combined with a wide-angle eyepiece lens is employed to project a fringe pattern onto the inspected surface. A CCD camera observes the projected fringes through another microscope with a phase mask. The phase mask enlarges the depth of field of the image acquisition system, while the wide-angle eyepiece lens increases the depth of focus of the fringe projection system. It is found that the depth measuring range has been extended up to 1600-micron, even though the depth of field of the image acquisition system is only 80-micron.
© (2010) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Wei-Hung Su and Chun-Hsiang Hsu "3D shape sensing using a phase mask to extend the depth measuring range", Proc. SPIE 7781, Photonic Fiber and Crystal Devices: Advances in Materials and Innovations in Device Applications IV, 77810Q (18 August 2010); https://doi.org/10.1117/12.859768
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Cited by 1 scholarly publication.
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KEYWORDS
Microscopes

Sensing systems

Image acquisition

Phase shift keying

Fourier transforms

Optical transfer functions

Inspection

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