Gray-level encoded fringe projection for profile measurements

Wei-Hung Su; Bo-Chin Huang

doi:10.1117/12.2190215

26 August 2015 Gray-level encoded fringe projection for profile measurements

Wei-Hung Su, Bo-Chin Huang

Proceedings Volume 9586, Photonic Fiber and Crystal Devices: Advances in Materials and Innovations in Device Applications IX; 95861F (2015) https://doi.org/10.1117/12.2190215
Event: SPIE Optical Engineering + Applications, 2015, San Diego, California, United States

Abstract

An encoding algorithm to identify the fringe orders for Fourier transform profilometry is described. Phase unwrapping is then performed with reference to the encoding algorithm. Even though the inspected object is colorful or sensitive to the reflectance variation, unwrapping can be performed without ambiguity. The computation cost is very low, and its unwrapped errors can be confined in a local area.

Citation Download Citation

Wei-Hung Su and Bo-Chin Huang "Gray-level encoded fringe projection for profile measurements", Proc. SPIE 9586, Photonic Fiber and Crystal Devices: Advances in Materials and Innovations in Device Applications IX, 95861F (26 August 2015); https://doi.org/10.1117/12.2190215

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