Zhi-Hsiang Liu
at National Sun Yat-sen Univ
SPIE Involvement:
Author
Publications (3)

Proceedings Article | 5 October 2023 Poster + Paper
Proceedings Volume 12682, 126820B (2023) https://doi.org/10.1117/12.2677320
KEYWORDS: Fringe analysis, Inspection, Phase unwrapping, Phase shifts, 3D metrology, Fourier transforms, Phase distribution, 3D projection, Reflectivity, Image sensors

Proceedings Article | 20 August 2020 Poster + Paper
Proceedings Volume 11498, 114980V (2020) https://doi.org/10.1117/12.2572294
KEYWORDS: Fringe analysis, Fourier transforms, Inspection, Projection systems, 3D metrology, Reflectivity, Image acquisition

Proceedings Article | 9 September 2019 Paper
Proceedings Volume 11123, 111230V (2019) https://doi.org/10.1117/12.2530715
KEYWORDS: Fringe analysis, Inspection, Fourier transforms, Image transmission, Bandpass filters, Reflectivity, 3D metrology, Image sensors, Imaging arrays, Optoelectronics

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