Photonic crystal scene projector development

J. A. Wilson; B. Burckel; J. Caulfield; S. Cogan; M. Massie; R. Lamott; D. Snyder; R. Rapp

doi:10.1117/12.852388

23 April 2010 Photonic crystal scene projector development

J. A. Wilson, B. Burckel, J. Caulfield, S. Cogan, M. Massie, R. Lamott, D. Snyder, R. Rapp

Proceedings Volume 7663, Technologies for Synthetic Environments: Hardware-in-the-Loop Testing XV; 766309 (2010) https://doi.org/10.1117/12.852388
Event: SPIE Defense, Security, and Sensing, 2010, Orlando, Florida, United States

Abstract

This paper describes results from the Extremely High Temperature Photonic Crystal System Technology (XTEMPS) program. The XTEMPS program is developing projector technology based on photonic crystals capable of high dynamic range, multispectral emission from SWIR to LWIR, and realistic band widths. These Photonics Crystals (PhC) are fabricated from refractory materials to provide high radiance and long device lifetime. Cyan is teamed with Sandia National Laboratories, to develop photonics crystals designed for realistic scene projection systems and Nova sensors to utilize their advanced Read In Integrated Circuit (RIIC). PhC based emitters show improved in-band output power efficiency when compared to broad band "graybody" emitters due to the absence of out-of-band emission. Less electrical power is required to achieve high operating temperature, and the potential for nonequilibrium pumping exists. Both effects boost effective radiance output. Cyan has demonstrated pixel designs compatible with Nova's medium format RIIC, ensuring high apparent output temperatures, modest drive currents, and low operating voltages of less than five volts. Unit cell pixel structures with high radiative efficiency have been demonstrated, and arrays using PhC optimized for up to four spectral bands have been successfully patterned.

Citation Download Citation

J. A. Wilson, B. Burckel, J. Caulfield, S. Cogan, M. Massie, R. Lamott, D. Snyder, and R. Rapp "Photonic crystal scene projector development", Proc. SPIE 7663, Technologies for Synthetic Environments: Hardware-in-the-Loop Testing XV, 766309 (23 April 2010); https://doi.org/10.1117/12.852388

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