Paper
2 September 2010 Front- and backside structuring of gratings for phase contrast imaging with x-ray tubes
J. Kenntner, T. Grund, B. Matthis, M. Boerner, J. Mohr, T. Scherer, M. Walter, M. Willner, A. Tapfer, M. Bech, F. Pfeiffer, I. Zanette, T. Weitkamp
Author Affiliations +
Abstract
Phase contrast imaging with conventional X-ray tubes as e.g. in computer tomography scanners (CTscanners) requires a setup of three different types of optical gratings. One grating is used to obtain a spatially coherent radiation, the second grating defines a periodic phase shift and the third is used as a periodic absorption grating. In order to absorb high energy radiation, absorption gratings with periods of a few microns only and extreme aspect ratios (>80) are fabricated, employing a modified LIGA process. However, above a critical structural height, structures collapse due to e.g. capillary effects. To overcome this limitation a new variant of the LIGA process has been developed. It is characterized by structuring of a resist on both sides of a membrane, resulting in a moderate aspect ratio on both sides of the membrane instead of an extreme aspect ratio on one side. To get a perfect overlay of both structures the grating structure on the front side of a membrane patterned by the standard LIGA-process is used as the mask for structuring the second resist layer on the backside of the membrane. A second electroforming step fills the gaps on the backside.
© (2010) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
J. Kenntner, T. Grund, B. Matthis, M. Boerner, J. Mohr, T. Scherer, M. Walter, M. Willner, A. Tapfer, M. Bech, F. Pfeiffer, I. Zanette, and T. Weitkamp "Front- and backside structuring of gratings for phase contrast imaging with x-ray tubes", Proc. SPIE 7804, Developments in X-Ray Tomography VII, 780408 (2 September 2010); https://doi.org/10.1117/12.859666
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Cited by 14 scholarly publications.
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KEYWORDS
X-rays

Absorption

Phase contrast

X-ray imaging

Visibility

Computed tomography

Interferometers

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