Paper
7 February 2011 Near-field mapping of spectroelectrochemical properties of polyaniline
R. Barillé, O. L. Gribkova, A. R. Tameev, A. A. Nekrasov, V. F. Ivanov, A. V. Vannikov
Author Affiliations +
Proceedings Volume 7994, LAT 2010: International Conference on Lasers, Applications, and Technologies; 79940O (2011) https://doi.org/10.1117/12.881030
Event: International Conference on Coherent and Nonlinear Optics (ICONO 2010) and International Conference on Lasers, Applications and Technologies (LAT 2010), 2010, Kazan, Russian Federation
Abstract
We combine in this work the measurement of local optical transmission in the near-field with the mapping of the third harmonic generation of semiconducting polymer samples. The use of a linear method with the scanning near-field optical microscope (SNOM) and a nonlinear method with the Third Harmonique Generation (THG) microscope reveal the variation and the nature of the nanomorphology of doped polyaniline thin films.
© (2011) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
R. Barillé, O. L. Gribkova, A. R. Tameev, A. A. Nekrasov, V. F. Ivanov, and A. V. Vannikov "Near-field mapping of spectroelectrochemical properties of polyaniline", Proc. SPIE 7994, LAT 2010: International Conference on Lasers, Applications, and Technologies, 79940O (7 February 2011); https://doi.org/10.1117/12.881030
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KEYWORDS
Near field scanning optical microscopy

Polymers

Absorption

Atomic force microscopy

Polymer thin films

Polymerization

Semiconductors

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