Paper
12 January 2012 Subpicosecond laser breakdown in optical thin films
Author Affiliations +
Proceedings Volume 8206, Pacific Rim Laser Damage 2011: Optical Materials for High Power Lasers; 82060D (2012) https://doi.org/10.1117/12.911285
Event: Pacific Rim Laser Damage Symposium: Optical Materials for High Power Lasers, 2011, Shanghai, China
Abstract
Experimental and theoretical progress on subpicosecond laser pulse breakdown in dielectric films is reviewed. The single pulse threshold fluences can be related to fundamental material properties and scaling laws with respect to pulse duration and material bandgap. Multiple pulse thresholds are controlled by native and laser-induced defects. A phenomenological model is introduced which describes the accumulation and relaxation of such defects. The model is able to explain the experiments and can be used to assess relevant defect parameters. Experimental results are presented that exemplify how the ambient atmosphere affects the multiple-pulse laser damage thresholds.
© (2012) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
W. Rudolph, L. A. Emmert, D. Nguyen, C. Karras, Z. Sun, and R. Weber "Subpicosecond laser breakdown in optical thin films", Proc. SPIE 8206, Pacific Rim Laser Damage 2011: Optical Materials for High Power Lasers, 82060D (12 January 2012); https://doi.org/10.1117/12.911285
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KEYWORDS
Dielectrics

Electrons

Laser damage threshold

Ionization

Pulsed laser operation

Laser induced damage

Laser optics

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