Lifetime evaluation of CMOS mixed signal devices

A. Linder; J. Furlong; N. Malone; D. Madajian; A. Kar-Roy

doi:10.1117/12.964388

24 October 2012 Lifetime evaluation of CMOS mixed signal devices

A. Linder, J. Furlong, N. Malone, D. Madajian, A. Kar-Roy

Proceedings Volume 8511, Infrared Remote Sensing and Instrumentation XX; 85110Y (2012) https://doi.org/10.1117/12.964388
Event: SPIE Optical Engineering + Applications, 2012, San Diego, California, United States

Abstract

New foundry processes continue to produce smaller features and new designs. These new devices must be screened to validate their usefulness for long lifetime use. The Failure-in-Time analysis in conjunction with foundry qualification information can be used to evaluate foundry device lifetimes. This analysis is a helpful tool when zero failure life tests are performed. The reliability of the device is estimated by applying the failure rate to the use conditions. JEDEC publications.^2,3,4 are the industry accepted methods.

Citation Download Citation

A. Linder, J. Furlong, N. Malone, D. Madajian, and A. Kar-Roy "Lifetime evaluation of CMOS mixed signal devices", Proc. SPIE 8511, Infrared Remote Sensing and Instrumentation XX, 85110Y (24 October 2012); https://doi.org/10.1117/12.964388

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