Common-path configuration in total internal reflection digital holography microscopy

M. Matrecano; A. Calabuig; M. Paturzo; P. Ferraro

doi:10.1117/12.2052848

1 May 2014 Common-path configuration in total internal reflection digital holography microscopy

M. Matrecano, A. Calabuig, M. Paturzo, P. Ferraro

Proceedings Volume 9132, Optical Micro- and Nanometrology V; 91321I (2014) https://doi.org/10.1117/12.2052848
Event: SPIE Photonics Europe, 2014, Brussels, Belgium

Abstract

TIRDHM is a technique that allows to analyse the phase change of microscopical sections produced on the prism surface due to material attached on the top. Therefore, due to the evanescence waves properties we can analyse quantitatively the properties and specific morphology located to few nanometers on the top of surface contact. In this work, we study and present an alternative method to off-axis configuration to record and analyse the microscopical phase object information in Total Internal Reflection dispensing with the use of reference arm.

Citation Download Citation

M. Matrecano, A. Calabuig, M. Paturzo, and P. Ferraro "Common-path configuration in total internal reflection digital holography microscopy", Proc. SPIE 9132, Optical Micro- and Nanometrology V, 91321I (1 May 2014); https://doi.org/10.1117/12.2052848

ACCESS THE FULL ARTICLE

INSTITUTIONAL
Select your institution to access the SPIE Digital Library.

SELECT YOUR INSTITUTION

PERSONAL
Sign in with your SPIE account to access your personal subscriptions or to use specific features such as save to my library, sign up for alerts, save searches, etc.

PERSONAL SIGN IN

No SPIE Account? Create one

PURCHASE THIS CONTENT

SUBSCRIBE TO DIGITAL LIBRARY

50 downloads per 1-year subscription

Members: $195

Non-members: $335 ADD TO CART

25 downloads per 1 - year subscription

Members: $145

Non-members: $250 ADD TO CART

PURCHASE SINGLE ARTICLE

Includes PDF, HTML & Video, when available