Paper
9 February 1989 Dependence Of Y-Branch Loss On Waveguide Mode Confinement
R. H. Rediker, L. M. Eriksen, T. A. Lind
Author Affiliations +
Abstract
The losses in the bends and branches associated with Y-junctions used in interferometers in LiNbO3 have been studied as a function of the mode confinement in the arms of the interferometers. Results are presented both when the confinement is changed by varying the fabrication technique and also when the confinement is changed by varying the incident wavelength. The technique used to measure the confinement is described. The two wavelengths of most interest in this study were λ = 0.51 µm and λ = 3.39 µm. These wavelengths span the major portion of the spectrum over which LiNbO3 is transparent.
© (1989) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
R. H. Rediker, L. M. Eriksen, and T. A. Lind "Dependence Of Y-Branch Loss On Waveguide Mode Confinement", Proc. SPIE 0994, Optoelectronic Materials, Devices, Packaging, and Interconnects II, (9 February 1989); https://doi.org/10.1117/12.960130
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KEYWORDS
Interferometers

Waveguides

Sensors

Wavefronts

Photomasks

Monochromators

Semiconducting wafers

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