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2 November 2016 CdTe imaging device driven by current integration mode (Conference Presentation)
Toru Aoki, Akifumi Koike, Takaharu Okunoyama, Hisashi Morii, Katsuyuki Takagi, Junichi Nishizawa
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Proceedings Volume 9968, Hard X-Ray, Gamma-Ray, and Neutron Detector Physics XVIII; 996809 (2016) https://doi.org/10.1117/12.2240381
Event: SPIE Optical Engineering + Applications, 2016, San Diego, California, United States
Abstract
We have developed the current integration mode CdTe imaging device with 100fps movie mode. The pixel pitch is 100um, and detector size is about 50mm x 45 mm with 4-CdTe-ASIC units and 1mm thick-CdTe. The data correction algorithms were developed and installed in FPGA and MPU with real time collection. We can find clear image with high contrast as direct conversion, for example, pipe-edge thickness detection, penetration image and movie of mechanical watch and so on. We can observe detail connection in printed circuit board by using rotation movie mode. Also it has high sensitivity in high energy region, so we can apply to get real-time movie in operation. We will show the demonstration movie and detail of this detector.
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Toru Aoki, Akifumi Koike, Takaharu Okunoyama, Hisashi Morii, Katsuyuki Takagi, and Junichi Nishizawa "CdTe imaging device driven by current integration mode (Conference Presentation)", Proc. SPIE 9968, Hard X-Ray, Gamma-Ray, and Neutron Detector Physics XVIII, 996809 (2 November 2016); https://doi.org/10.1117/12.2240381
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KEYWORDS
Imaging devices
Sensors
Algorithm development
Data corrections
Detection and tracking algorithms
Field programmable gate arrays
Current controlled current source
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