Paper
30 September 2016 Thermal conductivity studies of CdZnTe with varying Te excess
Maxx Jackson, Brittany Bennett, Dustin Giltnane, Stephen Babalola, Martin F. Ohmes, A. C. Stowe
Author Affiliations +
Abstract
Cadmium Zine Telluride (CZT) has been extensively studied as a room temperature semiconductor gamma radiation detector. CZT continues to show promise as a bulk and pixelated gamma spectrometer with less than one percent energy resolution; however the fabrication costs are high. Improved yields of high quality, large CZT spectroscopy grade crystals must be achieved. CZT is grown by the Traveling Heater Method (THM) with a Te overpressure to account for vaporization losses. This procedure creates Te rich zones. During growth, boules will often cleave limiting the number of harvestable crystals. As a result, crystal growth parameter optimization was evaluated by modeling the heat flow within the system. Interestingly, Cadmium Telluride (CdTe) is used as a thermal conductivity surrogate in the absence of a thorough study of the CZT thermal properties. The current study has measured the thermal conductivity of CZT pressed powders with varying Te concentrations from 50-100% over 25-800°C to understand the variation in this parameter from CdTe. Cd0.9Zn0.1Te1.0 is the base CZT (designated 50%). CZT exhibits a thermal conductivity of nearly 1 W/mK, an order of magnitude greater than CdTe. Further, the thermal conductivity decreased with increasing Te concentration.
© (2016) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Maxx Jackson, Brittany Bennett, Dustin Giltnane, Stephen Babalola, Martin F. Ohmes, and A. C. Stowe "Thermal conductivity studies of CdZnTe with varying Te excess", Proc. SPIE 9968, Hard X-Ray, Gamma-Ray, and Neutron Detector Physics XVIII, 99681E (30 September 2016); https://doi.org/10.1117/12.2237822
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Cited by 1 scholarly publication.
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KEYWORDS
Tellurium

Crystals

Solids

Sensors

Cadmium

Data modeling

Temperature metrology

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