Taking advantage of back reflections for full thin plane-parallel optics characterization

Rafael Porcar; Diego Ormaechea; Xavier Levecq; Nicolas Lefaudeux; Bérénice Renard

doi:10.1117/12.2688321

30 November 2023 Taking advantage of back reflections for full thin plane-parallel optics characterization

Rafael Porcar, Diego Ormaechea, Xavier Levecq, Nicolas Lefaudeux, Bérénice Renard

Proceedings Volume PC12778, Optifab 2023; PC127780B (2023) https://doi.org/10.1117/12.2688321
Event: SPIE Optifab, 2023, Rochester, New York, United States

Abstract

Despite (thin) Plane-Parallel Optics are present in most of our optronics consumer goods, research optical setups or industrial systems, the metrology of such optical components remains challenging. This is principally because having parallel front and back surfaces makes it difficult to filter optical signal coming from each diopter. In the specific case of Fizeau interferometers arrangements for example, fringe pattern generated by the three-beam interference is not suitable for precise surface shape reconstruction of the sample of interest. Imagine Optic has developed and patented a new approach that brings easy access to the optical testing of such samples, based on the combination of incoherent light and Shack Hartmann wavefront sensing. We will present the technique principle and how it works as implemented in a metrology system we called MESO. We will report the validation process of the approach and showcase results on real samples highlighting the advantages of the technique.

Conference Presentation

Citation Download Citation

Rafael Porcar, Diego Ormaechea, Xavier Levecq, Nicolas Lefaudeux, and Bérénice Renard "Taking advantage of back reflections for full thin plane-parallel optics characterization", Proc. SPIE PC12778, Optifab 2023, PC127780B (30 November 2023); https://doi.org/10.1117/12.2688321

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KEYWORDS

Reflection

Metrology

Optical filters

Tunable filters

Coating

Image filtering

Wavefront sensors

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