Advanced nano-characterization of an AlInN/GaN-based photonic bandgap crystal laser structure

Frank Bertram; Gordon Schmidt; Christoph Berger; Peter Veit; Jürgen Bläsing; Armin Dadgar; André Strittmatter; Juergen Christen

doi:10.1117/12.3000941

12 March 2024 Advanced nano-characterization of an AlInN/GaN-based photonic bandgap crystal laser structure

Frank Bertram, Gordon Schmidt, Christoph Berger, Peter Veit, Jürgen Bläsing, Armin Dadgar, André Strittmatter, Juergen Christen

Author Affiliations +

Proceedings Volume PC12880, Physics and Simulation of Optoelectronic Devices XXXII; PC1288005 (2024) https://doi.org/10.1117/12.3000941
Event: SPIE OPTO, 2024, San Francisco, California, United States

Abstract

Using nano-cathodoluminescence performed in scanning transmission electron microscope (STEM-CL), we have investigated a photonic-bandgap-crystal (PBC) laser structure at T = 17 K. In cross-sectional STEM images the full device structure is clearly resolved. The most dominant luminescence originates from the 3-fold MQW of the active region. The MQW shows a distinct peak wavelength change in growth direction indicating different structural and/or chemical properties of the individual quantum wells. In detail, a clear shift from 427 nm to 438 nm from the first to the top QW is observed, respectively.

Conference Presentation

Citation Download Citation

Frank Bertram, Gordon Schmidt, Christoph Berger, Peter Veit, Jürgen Bläsing, Armin Dadgar, André Strittmatter, and Juergen Christen "Advanced nano-characterization of an AlInN/GaN-based photonic bandgap crystal laser structure", Proc. SPIE PC12880, Physics and Simulation of Optoelectronic Devices XXXII, PC1288005 (12 March 2024); https://doi.org/10.1117/12.3000941

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