PERSONAL Sign in with your SPIE account to access your personal subscriptions or to use specific features such as save to my library, sign up for alerts, save searches, etc.
The optical train is a key element of each lithography scanner. The single patterning resolution limit of a scanner is determined by the characteristics and performance of its imaging system consisting of illumination and projection optics. In this paper, we present status and performance parameters of the next generation “High-NA EUV” optical system. Further, we discuss the current NA 0.33 optical system, where key parameters have been improved to support higher productivity in volume production. Additionally, the EUV roadmap and further progress of our developments will be shown.
Olaf Conradi,Paul Gräupner,Peter Kuerz,Wolfgang Seitz,Jan van Schoot, andRoel Moors
"Advancing EUV lithography optics supporting current roadmap and beyond", Proc. SPIE PC13215, International Conference on Extreme Ultraviolet Lithography 2024, PC1321503 (13 November 2024); https://doi.org/10.1117/12.3034698
ACCESS THE FULL ARTICLE
INSTITUTIONAL Select your institution to access the SPIE Digital Library.
PERSONAL Sign in with your SPIE account to access your personal subscriptions or to use specific features such as save to my library, sign up for alerts, save searches, etc.
The alert did not successfully save. Please try again later.
Olaf Conradi, Paul Gräupner, Peter Kuerz, Wolfgang Seitz, Jan van Schoot, Roel Moors, "Advancing EUV lithography optics supporting current roadmap and beyond," Proc. SPIE PC13215, International Conference on Extreme Ultraviolet Lithography 2024, PC1321503 (13 November 2024); https://doi.org/10.1117/12.3034698