Prof. Akira Sakai Profile

Prof. Akira Sakai

at Osaka Univ

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Publications (1)

Proceedings Article | 6 March 2021 Presentation

Operando analysis of local strain induced by inverse piezoelectric effect in AlGaN/GaN HEMT using synchrotron radiation nanobeam x-ray diffraction

Akira Sakai

Proceedings Volume 11686, 1168629 (2021) https://doi.org/10.1117/12.2577552

KEYWORDS: Field effect transistors, X-ray diffraction, Synchrotron radiation, Piezoelectric effects, Transistors, Semiconductors, Reliability, Crystals

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