Akito Katayama
at Keio Univ
SPIE Involvement:
Author
Publications (1)

Proceedings Article | 4 March 2019 Paper
Proceedings Volume 10908, 1090804 (2019) https://doi.org/10.1117/12.2506486
KEYWORDS: Femtosecond phenomena, Silicon carbide, Scanning electron microscopy, Metals, Carbon, Resistance, Thermal effects, Electronics, X-ray diffraction

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