Dr. Alexey Novikov
at Institute for Physics of Microstructures RAS
SPIE Involvement:
Author
Publications (4)

Proceedings Article | 12 September 2019 Paper
V. Rutckaia, V. Talalaev, F. Heyroth, A. Novikov, M. Shaleev, M. Petrov, D. Schulze, J. Schilling
Proceedings Volume 11081, 1108120 (2019) https://doi.org/10.1117/12.2528493
KEYWORDS: Luminescence, Resonators, Dielectrics, Quantum dots, Time metrology, Finite-difference time-domain method

Proceedings Article | 8 March 2019 Presentation
Viktoriia Rutckaia, Dominik Schulze, Mihail Petrov, Frank Heyroth, Vadim Talalaev, Alexey Novikov, Mikhail Shaleev, Joerg Schilling
Proceedings Volume 10927, 1092716 (2019) https://doi.org/10.1117/12.2514038
KEYWORDS: Silicon, Quantum dots, Silicon photonics, Optical properties, Semiconducting wafers, Carrier dynamics, Heterojunctions, Nanostructures, Magnetism

Proceedings Article | 17 September 2018 Presentation
Viktoriia Rutckaia, Joerg Schilling, Vadim Talalaev, Frank Heyroth, Alexey Novikov, Mikhail Shaleev, Mihail Petrov, Isabelle Staude
Proceedings Volume 10721, 107211J (2018) https://doi.org/10.1117/12.2320056
KEYWORDS: Silicon, Quantum dots, Silicon photonics, Optical properties, Semiconducting wafers, Carrier dynamics, Heterojunctions, Nanostructures, Magnetism

Proceedings Article | 11 June 2003 Paper
Yu. Drozdov, Z. Krasil'nik, D. Lobanov, A. Novikov, Mikhail Valakh, N. Vostokov, A. Yablonsky, V. Yukhymchuk
Proceedings Volume 5023, (2003) https://doi.org/10.1117/12.513596
KEYWORDS: Germanium, Silicon, Luminescence, Atomic force microscopy, Raman spectroscopy, Sensors, X-rays, Physics, X-ray diffraction, Spectroscopy

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