Amishav Ganot
at Ricor-Cryogenic & Vacuum Systems
SPIE Involvement:
Author
Publications (1)

Proceedings Article | 14 May 2007 Paper
Proceedings Volume 6542, 65422L (2007) https://doi.org/10.1117/12.722617
KEYWORDS: Temperature metrology, Cryogenics, Analog electronics, Infrared imaging, Thermography, Cryocoolers, Resistors, Reliability, Infrared radiation, Imaging systems

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