This paper is devoted to the research of solid-state matrix photomultiplier’s polarization-optical parameters. Maim parameters of SiPM detectors depend on photodetector’s sensitivity. As an object of study, a silicon photomultiplier ARRAY-C 60035-4P was chosen. Detector consists of 4 photosensitive sites. SiPM contains avalanche photodiodes separated from each other by elements that do not participate in the formation of the useful signal and are used for pacifying secondary optical signal. In this work experimental studies of the state of radiation’s polarization reflected from the surface of SiPM matrix’s active regions are performed using ellipsometer LEF-3F-1. The methodic used is a zero method of determining the polarization angles. During experiment the contractions of ellipsometric angles were determined. The experiment was carried out at four angles of incidence on the surface of the receiver, which corresponds to a set of reflective characteristics of a silicon photoelectric multiplier. Using this data, the estimation of distribution of the reflection and transmission coefficients becomes possible, as well as the sensitivity distribution over the different sites of the SiPM.
The work is devoted to the research of the polarization-optical parameters of a solid-state matrix photomultiplier. The main parameters of the performance of the SiPM form from the sensitivity of the photodetector. As an object of study, a silicon photomultiplier ARRAY-C 60035-4P was chosen, which consists of 4 photosensitive sites. The pixels of the SiPM are avalanche photodiodes that are separated from each other by elements that do not participate in the formation of the useful signal and serve to suppress the secondary optical signal due to the optical coupling between. In this paper, experimental studies of the state of polarization reflected from the surface of each of the active regions of the matrix of a silicon photomultiplier are performed using a laser photoelectric ellipsometer LEF-3F-1. The action of the ellipsometer is based on the zero method of determining the polarization angles. In the course of the experiment the contractions of ellipsometric angles were determined. The experiment was carried out at four angles of incidence on the surface of the receiver, which corresponds to a set of reflective characteristics of a silicon photoelectric multiplier. With the help of these data, the estimation of the distribution of the reflection and transmission coefficients becomes possible, as well as the sensitivity distribution over the different sites of the SiPM.
The main aspect in developing methods for optical diagnostics and visualization of biological tissues using polarized radiation is the transformation analysis of the state of light polarization when it is scattered by the medium. The polarization characteristic spatial distributions of the detected scattered radiation, in particular the degree of depolarization, have a pronounced anisotropy. The presence of optical anisotropy can provide valuable additional information on the structural features of the biological object and its physiological status. Analysis of the polarization characteristics of the scattered radiation of biological tissues in some cases provides a qualitatively new results in the study of biological samples. These results can be used in medicine and food industry.
The work is devoted to ellipsometric investigation of the structured reflecting surface of a matrix sensor. By the
generalized scheme of ellipsometry, the optical and geometric parameters of the layers of the matrix receiver can be
determined. These parameters include the thickness and refractive index. Ellipsometric angles were determined using
the ellipsometer. They are used as input data in the inverse ellipsometry problem. After determining the thickness and
refractive indices of the sensor layers, it is possible to calculate its transmittance.When this indicator is known ,the
sensitivity of the receiver can be calculated at the certain point. In this work the algorithm of the calculation of the
sensitivity of a matrix receiver of optical radiation is described ,the input data in this algorithm are considered to be the
ellipsometric angles.
The work is dedicated to the ellipsometric research of the pixel transparent structure within the matrix receiver of the optical radiation. The receiver consists of the four transparent layers ( for the colour sensor) and the three layers ( for the black-and-white sensor). Also the work concerns the measuring of the ellipsometric radiation options reflected from the surface layers of the sensitive element; in addition the work is about the receiving of the entering data to solve the inverse ellipsometric problem and the geometrical and optical calculation of the options of the multilayer structure. The diven work presents the iterative algorithm to solve the inverse ellipsometric problem, the method of the experimental researching and the measuring results of the polarization characteristics of the reflected radiation in according to the inside and the outside samples’ options.
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