Dr. Andreas Wieser Profile

Dr. Andreas Wieser

at ETH Zurich

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Author

Publications (7)

SPIE Journal Paper | 21 November 2023 Open Access

Classification of material and surface roughness using polarimetric multispectral LiDAR

Yu Han, David Salido-Monzú, Andreas Wieser

OE, Vol. 62, Issue 11, 114104, (November 2023) https://doi.org/10.1117/12.10.1117/1.OE.62.11.114104

KEYWORDS: Reflectivity, LIDAR, Surface roughness, Polarimetry, Spectral resolution, Optical engineering, Polarization, Avalanche photodetectors, Bandpass filters, Tunable filters

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Proceedings Article | 9 August 2023 Presentation + Paper

Supercontinuum-based hyperspectral laser scanning: towards enhanced 3D surface reconstruction and its benefits for remote sensing

Pabitro Ray, David Salido-Monzú, Andreas Wieser, Tomislav Medić

Proceedings Volume 12621, 126210M (2023) https://doi.org/10.1117/12.2673800

KEYWORDS: LIDAR, Hyperspectral sensing, Laser scanners, Vegetation, Remote sensing, Reflectivity, 3D acquisition, Avalanche photodetectors, Radiometric corrections, Point clouds

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Proceedings Article | 9 August 2023 Presentation + Paper

Classification of material and surface roughness using polarimetric multispectral LiDAR

Yu Han, David Salido-Monzú, Andreas Wieser

Proceedings Volume 12621, 126210D (2023) https://doi.org/10.1117/12.2671625

KEYWORDS: Reflectivity, LIDAR, Surface roughness, Polarimetry, Polarization, Avalanche photodetectors, Specular reflections, Remote sensing, Cross validation, Linear polarizers

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Proceedings Article | 20 May 2022 Presentation + Paper

Polarimetric femtosecond-laser LiDAR for multispectral material probing

Yu Han, David Salido-Monzú, Jemil Avers Butt, Andreas Wieser

Proceedings Volume 12137, 121370B (2022) https://doi.org/10.1117/12.2624458

KEYWORDS: Multispectral sensing, Hyperspectral target detection, Femtosecond frequency combs, Active remote sensing, Polarization, Polarimetry, LIDAR, Classification systems

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Proceedings Article | 21 June 2019 Presentation + Paper

Simulation of 3D laser scanning with phase-based EDM for the prediction of systematic deviations

Sukant Chaudhry, David Salido-Monzú, Andreas Wieser

Proceedings Volume 11057, 110570H (2019) https://doi.org/10.1117/12.2526043

KEYWORDS: Optical simulations, Reflectivity, Distance measurement, Laser scanners, 3D scanning, Numerical simulations, Reflection, Modulation, Phase measurement, Scanners

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Reflectorless electro-optical distance measurement (RL-EDM) relies on measuring the round-trip time of optical signals transmitted from the instrument and reflected by natural surfaces. It is the backbone of laser scanning technology, which allows easily digitizing the environment and obtaining 3d models that represent the geometry of the scanned objects. However, the measured distances do not refer to single, well-defined target points at the object surface but rather correspond to a weighted average of effective distances within the respective footprint of the laser beam. This increases the uncertainty of the measurements and may cause systematic deviations significantly exceeding the mm-or sub-mm level precision that would otherwise be attainable with EDM technology. In this paper we introduce a numerical simulation of the measurement process for phase-based RL-EDM with I/Q-demodulation assuming a Gaussian beam profile. The beam is discretized into a fixed number of rays for each of which the corresponding phase delay and attenuation are calculated. The I- and Q-components are obtained by integration over the footprint taking the beam profile into account. By deflection of the beam into incrementally changed spatial directions we extend the simulation to one of the 3d scanning process. The scanned surfaces are represented by triangular irregular meshes (TINs) with high spatial resolution. Each triangle is associated with a reflectivity, as a starting point for the modelling of surface properties. The simulation takes the interplay between the energy distribution within the laser footprint, the surface geometry and the surface reflectivity into account. Herein, we use the simulation framework to study the effects of the angle of incidence, of surface curvature and of mixed pixels in absence of measurement noise. The results indicate that the angle of incidence at a planar surface and the surface curvature within the footprint are on the order of 0.1 mm or less for small footprint and angles of incidence below about 60 deg. If the footprint and the angle of incidence are very large the biases may reach mm-level, however even then the impact of measurement noise and surface roughness will typically exceed these biases, such that they are negligible. On the other hand we show using simulations and real scans of a cylinder in front of a planar background, that the impact of mixed pixels or beams only partially hitting an object may introduce large biases and is practically relevant.

Proceedings Article | 21 June 2019 Presentation + Paper

An approach to combined multispectral reflectorless distance measurement and material probing

David Salido-Monzú, Andreas Wieser

Proceedings Volume 11056, 110561Q (2019) https://doi.org/10.1117/12.2525841

KEYWORDS: Distance measurement, Sensors, Phase measurement, Reflectivity, Calibration, Atmospheric propagation, Avalanche photodetectors, Laser scanners, Mode locking, Femtosecond phenomena

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SPIE Journal Paper | 27 April 2018

Simultaneous distance measurement at multiple wavelengths using the intermode beats from a femtosecond laser coherent supercontinuum

David Salido-Monzú, Andreas Wieser

OE, Vol. 57, Issue 04, 044107, (April 2018) https://doi.org/10.1117/12.10.1117/1.OE.57.4.044107

KEYWORDS: Distance measurement, Sensors, Femtosecond phenomena, Optical engineering, Mode locking, Modulation, Refractive index, Calibration, Interferometry, Optical filters

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Showing 5 of 7 publications

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