Bartosz Banachowicz
Engineer at Cypress Semiconductor Corp
SPIE Involvement:
Author
Publications (4)

Proceedings Article | 12 February 2010 Paper
Alex Gourevitch, Thomas Thurston, Rajiv Singh, Bartosz Banachowicz, Vladimir Korobov, Cliff Drowley
Proceedings Volume 7617, 761711 (2010) https://doi.org/10.1117/12.842694
KEYWORDS: Metals, Sensors, Optical filters, Light emitting diodes, Solid state lighting, Prototyping, Photodiodes, Temperature metrology, Optical sensors, RGB color model

Proceedings Article | 23 September 2009 Paper
B. Delauré, S. Livens, J. Everaerts, R. Kleihorst, Gert Schippers, Yannick De Wit, John Compiet, Bartosz Banachowicz
Proceedings Volume 7474, 74741D (2009) https://doi.org/10.1117/12.830448
KEYWORDS: Sensors, CMOS sensors, Unmanned aerial vehicles, Modulation transfer functions, Imaging systems, Quantum efficiency, Camera shutters, Image resolution, Cameras, Semiconductors

Proceedings Article | 3 May 2004 Paper
Proceedings Volume 5379, (2004) https://doi.org/10.1117/12.535975
KEYWORDS: Diffusion, Oxides, Photomasks, Metals, Tolerancing, Phase shifts, Optical proximity correction, Etching, Printing, Optical alignment

Proceedings Article | 28 May 2003 Paper
Proceedings Volume 5148, (2003) https://doi.org/10.1117/12.514949
KEYWORDS: Optical proximity correction, Silicon, Databases, Calibration, Computer aided design, Data modeling, Model-based design, Cadmium, Solid modeling, Error analysis

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