Dr. Ben Jeurissen
at Univ Antwerpen
SPIE Involvement:
Author
Publications (1)

Proceedings Article | 14 October 2022 Presentation + Paper
Ben Huyge, Ben Jeurissen, Jan De Beenhouwer, Jan Sijbers
Proceedings Volume 12242, 122420V (2022) https://doi.org/10.1117/12.2633482
KEYWORDS: X-rays, Deconvolution, Scattering, X-ray imaging, Photomasks, Monte Carlo methods, Tomography, Signal attenuation

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