Brian K. Hatchell
at Pacific Northwest National Lab
SPIE Involvement:
Author
Publications (9)

Proceedings Article | 9 May 2012 Paper
Bruce Bernacki, James Kelly, David Sheen, Brian Hatchell, Patrick Valdez, Jonathan Tedeschi, Thomas Hall, Douglas McMakin
Proceedings Volume 8362, 836207 (2012) https://doi.org/10.1117/12.917773
KEYWORDS: Optical instrument design, Reflectors, Optical design, Polarization, Millimeter wave imaging, Telescopes, Mirrors, Imaging systems, Monochromatic aberrations, Telescope design

Proceedings Article | 28 February 2012 Paper
B. Bernacki, J. Kelly, D. Sheen, D. McMakin, J. Tedeschi, R. Harris, A. Mendoza, T. Hall, B. Hatchell, P. L. Valdez
Proceedings Volume 8259, 82590F (2012) https://doi.org/10.1117/12.909756
KEYWORDS: Extremely high frequency, Polarimetry, Imaging systems, Polarization, Image enhancement, Passive millimeter wave imaging, Radiometry, Millimeter wave imaging, Image analysis, Principal component analysis

Proceedings Article | 26 May 2011 Paper
B. Bernacki, J. Kelly, D. Sheen, D. McMakin, J. Tedeschi, T. Hall, B. Hatchell, P. L. Valdez
Proceedings Volume 8022, 80220C (2011) https://doi.org/10.1117/12.883545
KEYWORDS: Extremely high frequency, Polarization, Imaging systems, Polarimetry, Image analysis, Principal component analysis, Radiometry, Passive millimeter wave imaging, Reflectors, Wind energy

Proceedings Article | 27 April 2010 Paper
David Sheen, Thomas Hall, Ronald Severtsen, Douglas McMakin, Brian Hatchell, Patrick Valdez
Proceedings Volume 7670, 767008 (2010) https://doi.org/10.1117/12.852788
KEYWORDS: Imaging systems, Standoff detection, Transceivers, Mirrors, Weapons, 3D image processing, Reflectors, Prototyping, Scanners, Explosives

Proceedings Article | 9 April 2010 Paper
Brian Hatchell, Fred Mauss, Emiliano Santiago-Rojas, Ivan Amaya, Jim Skorpik, Kurt Silvers, Steve Marotta
Proceedings Volume 7650, 76501A (2010) https://doi.org/10.1117/12.846005
KEYWORDS: Missiles, Sensors, Magnetic sensors, Reliability, Detection and tracking algorithms, Microelectromechanical systems, Inspection, Switches, Transducers, Temperature metrology

Showing 5 of 9 publications
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