Prof. Chao-Wen Liang
Associate Professor at National Central Univ
SPIE Involvement:
Conference Program Committee | Author
Publications (12)

Proceedings Article | 19 September 2018 Paper
Hung-Sheng Chang, Chao-Wen Liang
Proceedings Volume 10747, 1074706 (2018) https://doi.org/10.1117/12.2322975
KEYWORDS: Monochromatic aberrations, Wavefront sensors, Optical alignment, Optics manufacturing, Tolerancing, Wavefronts, Optical components, Sensors, Zernike polynomials, Optical testing

Proceedings Article | 28 August 2016 Presentation + Paper
Hao-Xun Zhan, Chao-Wen Liang, Shih-Che Chien
Proceedings Volume 9960, 99600O (2016) https://doi.org/10.1117/12.2236289
KEYWORDS: Optical testing, Deflectometry, Optical testing, Wavefronts, Phase shifting, Charge-coupled devices, Pico projectors, Projection systems, Gaussian beams, Wavefront aberrations, Data acquisition

Proceedings Article | 12 September 2014 Paper
Jhe Syuan Lin, Chao Wen Liang, Shih-Che Chien, Min-Fong Luo
Proceedings Volume 9193, 91930Z (2014) https://doi.org/10.1117/12.2062593
KEYWORDS: Liquid crystal on silicon, Relays, CCD image sensors, Spatial light modulators, Modulation, Image sensors, Distortion, Photography, Optical design, Modulation transfer functions

Proceedings Article | 18 August 2014 Paper
Proceedings Volume 9203, 92030I (2014) https://doi.org/10.1117/12.2061493
KEYWORDS: Interferometers, Zernike polynomials, Wavefronts, Fizeau interferometers, Phase measurement, Monochromatic aberrations, Optical testing, Interferometry, Phase interferometry, Aspheric lenses

Proceedings Article | 10 September 2013 Paper
Proceedings Volume 8844, 88440B (2013) https://doi.org/10.1117/12.2023671
KEYWORDS: Zernike polynomials, Wavefronts, Telescopes, Mirrors, Optical aberrations, Optical alignment, Calcium, Monochromatic aberrations, Nonlinear response, Ray tracing

Showing 5 of 12 publications
Conference Committee Involvement (31)
Optical Metrology and Inspection for Industrial Applications XII
11 October 2025 | Beijing, China
Optical System Alignment, Tolerancing, and Verification XVI
3 August 2025 | San Diego, California, United States
Optical Metrology and Inspection for Industrial Applications XI
12 October 2024 | Nantong, Jiangsu, China
Optical System Alignment, Tolerancing, and Verification XV
18 August 2024 | San Diego, California, United States
Optical Metrology and Inspection for Industrial Applications X
15 October 2023 | Beijing, China
Showing 5 of 31 Conference Committees
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