Christopher M. Bowen
at Anduril Industries
SPIE Involvement:
Author
Publications (1)

Proceedings Article | 21 May 2020 Presentation + Paper
Michael Kelly, Justin Baker, Joseph Bari, Christopher Bowen, Matthew Brown, Curtis Colonero, Christopher David, Matthew Karas, Brian Lieb, William Ross, Lauren White
Proceedings Volume 11407, 1140712 (2020) https://doi.org/10.1117/12.2560158
KEYWORDS: Temperature metrology, Infrared imaging, Imaging systems, Thermography, Infrared radiation, Sensors, Long wavelength infrared, Image processing, Readout integrated circuits

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