CONFERENCE PROCEEDINGS
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Connor Aubry
at Sandia National Labs.
SPIE Involvement:
Author
Publications (4)
Proceedings Article | 14 June 2023 Presentation + Paper
Developing a comprehensive, adaptive system for large-scale x-ray images
Robert Forrest, Daniel Krofcheck, Asael Sorensen, Carter Jameson, Connor Aubry, Eion Blanchard
Proceedings Volume 12531, 1253109 (2023) https://doi.org/10.1117/12.2666138
KEYWORDS: Object detection, X-rays, X-ray imaging, Data modeling, Design and modelling, Detection and tracking algorithms, Performance modeling, Image classification, Education and training, Inspection
Proceedings Article | 3 June 2022 Presentation + Paper
Developing a comprehensive, adaptive system for large scale x-ray images
Robert Forrest, Daniel Krofcheck, Esther John, Hugh Galloway, Asael Sorensen, Carter Jameson, Connor Aubry, Arvind Prasadan, Jennifer Galasso, Eric Goodman
Proceedings Volume 12104, 1210408 (2022) https://doi.org/10.1117/12.2619020
KEYWORDS: X-rays, Inspection, Data modeling, X-ray imaging, Sensors, Detection and tracking algorithms, Image segmentation, Algorithm development, Performance modeling
Proceedings Article | 3 June 2022 Presentation + Paper
Synthetic threat injection using digital twin informed augmentation
Daniel Krofcheck, Esther John, Hugh Galloway, Asael Sorensen, Carter Jameson, Connor Aubry, Arvind Prasadan, Robert Forrest
Proceedings Volume 12104, 1210407 (2022) https://doi.org/10.1117/12.2618972
KEYWORDS: Data modeling, X-rays, X-ray imaging, Target detection, Digital imaging, Algorithm development, Sensors, X-ray detectors, Performance modeling
Proceedings Article | 3 June 2022 Presentation + Paper
Resilient adjudication in non-intrusive inspection with hierarchical object and anomaly detection
Daniel Krofcheck, Esther John, Hugh Galloway, Asael Sorensen, Carter Jameson, Connor Aubry, Arvind Prasadan, Jennifer Galasso, Eric Goodman, Eion Blanchard, Robert Forrest
Proceedings Volume 12104, 121040F (2022) https://doi.org/10.1117/12.2618978
KEYWORDS: Detection and tracking algorithms, Performance modeling, Data modeling, Process modeling, Evolutionary algorithms, Machine vision, Inspection, X-rays, X-ray detectors, Machine learning
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