Mr. Dong Ryul Kwak Profile

Dong Ryul Kwak

at Seoul National Univ of Science and Technology

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Publications (2)

Proceedings Article | 11 April 2013 Paper

Multilayer transfer matrix characterization of complex materials with scanning acoustic microscopy

Jeong Nyeon Kim, Richard Tutwiler, Dong Ryul Kwak, Ikkeun Park, Chiaki Miyasaka

Proceedings Volume 8694, 86941O (2013) https://doi.org/10.1117/12.2012255

KEYWORDS: Acoustics, Silicon, Multilayers, Titanium, Platinum, Solids, Thin films, Reflectivity, Microscopy, Transducers

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Proceedings Article | 9 April 2013 Paper

Visualization of interior structures with nanoscale resolution using ultrasonic-atomic force microscopy

Dong Ryul Kwak, Sun Hee Kim, Ik Keun Park, Judith Todd, Chiaki Miyasaka

Proceedings Volume 8691, 869117 (2013) https://doi.org/10.1117/12.2012244

KEYWORDS: Polymethylmethacrylate, Visualization, Microscopy, Atomic force microscopy, Silica, Silicon, Acoustics, Semiconducting wafers, Silicon films, Thin films

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