Eun-Young Lee
at Soongsil University
SPIE Involvement:
Author
Publications (1)

Proceedings Article | 26 January 2017 Paper
Eun-Young Lee, Jonghee Son, Dongho Kim
Proceedings Volume 10160, 101600G (2017) https://doi.org/10.1117/12.2255034
KEYWORDS: Reliability, Error analysis, Statistical analysis, Analytical research, Eye, Telecommunications, Standards development, Computing systems, Infrared cameras, Cameras

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