Dr. Fei Gao
at Xi’an Jiaotong Univ.
SPIE Involvement:
Author
Publications (1)

Proceedings Article | 7 March 2019 Paper
Proceedings Volume 11053, 110530Z (2019) https://doi.org/10.1117/12.2511378
KEYWORDS: Connectors, Defect detection, Visual process modeling, Detection and tracking algorithms, Image segmentation, Machine vision, Principal component analysis, Image filtering

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