Dr. Freddy Anstotz Profile

Dr. Freddy Anstotz

Researcher at ICube

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Publications (9)

Proceedings Article | 24 May 2018 Paper

Immersion white light scanning interferometry using elastic polymer path length compensation

Husneni Mukhtar, Paul Montgomery, Freddy Anstotz, Rémi Barillon, Anne Rubin

Proceedings Volume 10678, 1067816 (2018) https://doi.org/10.1117/12.2315474

KEYWORDS: Objectives, Mirrors, Microscopes, Water, Polymers, Liquids, Silicon, Interferometry, Beam splitters, Interferometers

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Proceedings Article | 24 May 2018 Presentation

Probing the viscoelastic properties of ultrathin polymer films by combining coherent scanning interferometry and nanobubble inflation (Conference Presentation)

Pierre Chapuis, Christian Gauthier, Damien Favier, Anne Rubin, Freddy Anstotz, Paul Montgomery

Proceedings Volume 10677, 106770U (2018) https://doi.org/10.1117/12.2306441

KEYWORDS: Interferometry, Polymers, Polymer thin films, Glasses, Software development, Physics, Microscopes, Phase shifting, Microscopy, LabVIEW

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Glass formation and glassy behavior remain areas of investigation in soft matter physics with many aspects which are still not completely understood, especially at the nanometer size-scale and close to the glass transition temperature. In the present work, we show an extension of the “nanobubble inflation” method developed by O’Connell and McKenna [Rev. Sci. Instrum. 78, 013901 (2007)] which uses an interferometric microscope (white light scanning interferometry method) to measure the surface topography of a large array of 5 μm sized nanometer thick films. These so-called free-standing films are subjected to constant inflation pressure during which the nanobubbles grow or creep with time. Measurements of multiple bubbles in real time are possible via the technique of Phase Shifting Microscopy (PSM) thanks to the fast acquisition and processing of interferometry. This has been implemented using in-house developed LabVIEW based software combined with the IMAQ Vision module. Moreover this technique has the advantage, over the AFM method of O’Connell and McKenna, to be a true non-contact technique. Using this optical configuration, there is no substrate interaction to affect the polymer chains. Here we demonstrate the method using ultra-thin films of both poly(vinyl acetate) (PVAc) and polystyrene (PS) and discuss the capabilities of the method in comparison to AFM, with its advantages and disadvantages. The viscoelastic responses of the nanobubbles are determined by measuring their time-dependent diameters and then by extracting both the stress and strain time-dependent components (here the history of the polymer films has to be taken into account). We show that the results from experiments on PVAc are consistent with the prior work on PVAc. However high stress results with PS show signs of a new non-linear response regime that could be related to the plasticity of the ultra-thin film. Our homemade setup used to apply stresses on the films is also described. This first allows the control of both temperature, using a Peltier ring which surrounds the sample, and pressure, using gas flow linked to a manometer. Then major improvements of our setup in order to solve small experimental issues are described. Finally, plans for further improvements to the cell are explained for future experiments.

Proceedings Article | 26 April 2016 Paper

Overview of label-free far field optical nanoscopy techniques for nanometrology

Paul Montgomery, Audrey Leong-Hoï, Freddy Anstotz, Hui Liu, Bertrand Simon, Matthieu Debailleul, Olivier Haeberlé

Proceedings Volume 9890, 98900G (2016) https://doi.org/10.1117/12.2227582

KEYWORDS: Super resolution microscopy, Microscopy, Super resolution, Nanostructures, Optical imaging, Image resolution, Molecules, Digital holography, Nanoparticles, Confocal microscopy, Time division multiplexing, Tomography, Deconvolution, Optical microscopy

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Proceedings Article | 26 April 2016 Paper

High-resolution full-field optical coherence tomography using high dynamic range image processing

A. Leong-Hoï, R. Claveau, P. Montgomery, B. Serio, W. Uhring, F. Anstotz, M. Flury

Proceedings Volume 9890, 98900E (2016) https://doi.org/10.1117/12.2227114

KEYWORDS: Image resolution, Signal to noise ratio, Image enhancement, Signal processing

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Proceedings Article | 21 June 2015 Paper

Detection of defects in a transparent polymer with high resolution tomography using white light scanning interferometry and noise reduction

A. Leong-Hoï, R. Claveau, M. Flury, W. Uhring, B. Serio, F. Anstotz, P. Montgomery

Proceedings Volume 9528, 952807 (2015) https://doi.org/10.1117/12.2184559

KEYWORDS: Image processing, Signal to noise ratio, Polymers, Tomography, Denoising, Cameras, Signal processing, Particles, Interferometry, CCD cameras

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Proceedings Article | 27 May 2011 Paper

High-speed, on-line 4D microscopy using continuously scanning white light interferometry with a high-speed camera and real-time FPGA image processing

P. Montgomery, F. Anstotz, J. Montagna

Proceedings Volume 8082, 808210 (2011) https://doi.org/10.1117/12.889334

KEYWORDS: 3D image processing, 3D acquisition, 3D metrology, Image processing, Field programmable gate arrays, Microscopy, Image resolution, Time metrology, Image acquisition, Modulation

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Proceedings Article | 18 June 2007 Paper

Development of a 3D dynamic measurement system using a high-speed camera with white light scanning interference microscopy associated with real-time FPGA image processing

Gyasi Johnson, Paul Montgomery, Freddy Anstotz, Renaud Kiefer

Proceedings Volume 6616, 661633 (2007) https://doi.org/10.1117/12.726394

KEYWORDS: 3D metrology, 3D image processing, Field programmable gate arrays, Microscopy, Image processing, Cameras, Imaging systems, High speed cameras, Digital signal processing, Modulation

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Proceedings Article | 10 November 1998 Paper

FILTRES128: front-end readout electronic development for silicon microstrip detectors

Freddy Anstotz, Y. Hu, J. Michel, J.-L. Sohler, D. Lachartre

Proceedings Volume 3445, (1998) https://doi.org/10.1117/12.330292

KEYWORDS: Analog electronics, Deconvolution, Capacitors, Multiplexers, Silicon, Sensors, Signal processing, Curium, Amplifiers, Resistors

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Proceedings Article | 10 November 1998 Paper

Design and preliminary results of APVD: a fast low-noise low-power rad-hard CMOS mixed circuit for the CMS silicon tracker at LHC

S. Gardien, P. Pangaud, J.-P. Walder, U. Goerlach, C. Hoffmann, C. Hu, A. Lounis, C. Maazouzi, P. Schmitt, G. Hall, M. Raymond, Freddy Anstotz, J.-D. Berst, G. Deptuch, Y. Hu, J.-L. Sohler, Renato Turchetta, Pierre Borgeaud, D. Lachartre, Marcus French, R. Robert

Proceedings Volume 3445, (1998) https://doi.org/10.1117/12.330291

KEYWORDS: Signal processing, Silicon, Deconvolution, Curium, Multiplexers, Calibration, Transistors, Capacitance, Resistors, Signal detection

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Showing 5 of 9 publications

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