Dr. Garrett D. Cole
at Thorlabs Crystalline Solutions
SPIE Involvement:
Conference Program Committee | Author | Startup Challenge Judge
Publications (22)

Proceedings Article | 13 March 2024 Presentation
Proceedings Volume PC12868, PC1286809 (2024) https://doi.org/10.1117/12.3001729
KEYWORDS: Sodium, Silicon carbide, YAG lasers, Wafer bonding, Tunable filters, Solids, Semiconductors, Semiconductor lasers, Optical filters, Mirrors

Proceedings Article | 13 March 2024 Presentation
Proceedings Volume PC12902, PC1290202 (2024) https://doi.org/10.1117/12.3010146
KEYWORDS: Semiconductor lasers, Semiconductors, Disk lasers, Wafer-level optics, Visible radiation, Silicon carbide, Prototyping, Optics manufacturing, Mirrors, Manufacturing

Proceedings Article | 17 March 2023 Presentation
Proceedings Volume 12404, 124040A (2023) https://doi.org/10.1117/12.2649412
KEYWORDS: Silicon carbide, YAG lasers, Thermal efficiency, Sodium guide stars, Sodium, Second-harmonic generation, Optical filters, Fabry–Perot interferometers, Diamond, Chemical species

Proceedings Article | 14 March 2023 Presentation + Paper
Proceedings Volume 12404, 1240407 (2023) https://doi.org/10.1117/12.2666028
KEYWORDS: Mode locking, Vertical external cavity surface emitting lasers, Semiconductors, Gallium arsenide, Quantum wells, Mirrors, Output couplers

Proceedings Article | 2 December 2022 Presentation + Paper
Proceedings Volume 12300, 123000D (2022) https://doi.org/10.1117/12.2641048
KEYWORDS: Thin film coatings, Adaptive optics, Prototyping, Glasses, Optical coatings, Deformable mirrors, Digital micromirror devices, Crystals, Mirrors

Showing 5 of 22 publications
Conference Committee Involvement (9)
Advances in Optical Thin Films VIII
8 April 2024 | Strasbourg, France
Optical Metrology and Inspection for Industrial Applications X
15 October 2023 | Beijing, China
Optical Metrology and Inspection for Industrial Applications IX
5 December 2022 | Online Only, China
Optical Metrology and Inspection for Industrial Applications VIII
11 October 2021 | Nantong, JS, China
Optical Metrology and Inspection for Industrial Applications VII
12 October 2020 | Online Only, China
Showing 5 of 9 Conference Committees
SIGN IN TO:
  • View contact details

UPDATE YOUR PROFILE
Is this your profile? Update it now.
Don’t have a profile and want one?

Advertisement
Advertisement
Back to Top