Mr. Georgios Nousios Profile

Georgios Nousios

at Aristotle Univ of Thessaloniki

SPIE Involvement:

Author

Publications (1)

This will count as one of your downloads.

You will have access to both the presentation and article (if available).

DOWNLOAD NOW

This content is available for download via your institution's subscription. To access this item, please sign in to your personal account.

Email or Username Forgot your username?

Password Forgot your password?

Show

Keep me signed in

No SPIE account? Create an account

Proceedings Article | 10 June 2024 Presentation + Paper

Modelling 2D-material-enhanced metasurfaces and gratings with quasinormal modes

Thomas Christopoulos, Georgios Nousios, Emmanouil Kriezis, Odysseas Tsilipakos

Proceedings Volume 12990, 1299003 (2024) https://doi.org/10.1117/12.3021970

KEYWORDS: Graphene, Finite element methods, 2D materials, Metamaterials

Read Abstract +

A multimode framework that can be utilized in the analysis and design of general, non-Hermitian periodic systems that comprise contemporary 2D materials is developed. The theoretical framework is based on the concept of Quasinormal Modes (QNMs) that can be used to efficiently retrieve the spectral response of periodic systems. Both sub- and super-wavelength lattice constants are examined with extra care to include propagating higher diffraction orders. The framework is employed in two indicative configurations, a graphene-based periodic metasurface that supports tightly confined graphene surface plasmons, and a periodic dielectric metasurface enhanced with a transition metal dichalcogenide layer that supports quasi bound states in the continuum. Both configurations are of fundamental and practical interest since they exhibit controllable resonant response and, in addition, the electromagnetic properties of the involved 2D materials can be electrically tuned. The Finite Element Method (FEM) is used to retrieve the QNMs, which are then fed to the framework to specify the spectral response for the zeroth and higher diffraction orders. Full-wave FEM simulations are used to verify the validity of obtained results.

My Library

You currently do not have any folders to save your paper to! Create a new folder below.

Folder Name

Folder Description

View contact details

UPDATE YOUR PROFILE

Is this your profile? Update it now.

Sign into your SPIE.org account

Don’t have a profile and want one?

Create an account on SPIE.org

Access to the requested content is limited to institutions that have purchased or subscribe to SPIE eBooks. You are receiving this notice because your organization may not have SPIE eBooks access.*

*Shibboleth/Open Athens users─please sign in to access your institution's subscriptions.

To obtain this item, you may purchase the complete book in print or electronic format on SPIE.org.

ORGANIZATIONAL
Sign in with credentials provided by your organization.

Organizational Username

Organizational Password

Show/Hide Password

INSTITUTIONAL
Select your institution to access the SPIE Digital Library.

SELECT YOUR INSTITUTION

PERSONAL
Sign in with your SPIE account to access your personal subscriptions or to use specific features such as save to my library, sign up for alerts, save searches, etc.

PERSONAL SIGN IN

No SPIE Account? Create one

PURCHASE THIS CONTENT

SUBSCRIBE TO DIGITAL LIBRARY

50 downloads per 1-year subscription

Members: $195

Non-members: $335 ADD TO CART

25 downloads per 1 - year subscription

Members: $145

Non-members: $250 ADD TO CART

PURCHASE SINGLE ARTICLE

Includes PDF, HTML & Video, when available

Members:

Non-members: ADD TO CART

Keywords/Phrases

Search In:

Publication Years