Prof. Gerhard Kahmen Profile

Prof. Gerhard Kahmen

at Leibniz Institute for High Performance Microelectronics (IHP)

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Publications (2)

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Proceedings Article | 19 October 2023 Presentation + Paper

In-orbit VNIR sensor quality validation

Johannes Buschek, Andreas Eckardt, Kristian Manthey, Karsten Sengebusch, Olaf Schrey, Denis Piechaczek, Gerhard Kahmen

Proceedings Volume 12729, 1272913 (2023) https://doi.org/10.1117/12.2680166

KEYWORDS: Sensors, Readout integrated circuits, Imaging systems, Design and modelling, Charge-coupled devices, Microelectronics, Systems modeling, Silicon, Robotics, Radiation effects

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The Institute of Optical Sensor Systems (OS) at the Robotics and Mechatronics Center of the German Aerospace Center (DLR) has more than 40 years of experience in high-resolution imaging and imaging technology. This paper presents the current status of the institute’s work on next-generation CMOS-TDI detector development. Together with the partners IHP (Leibniz Institute for High Performance Microelectronics), IMS (Fraunhofer Institute for Microelectronic Circuits and Systems), and JOP (Jena-Optronik GmbH), a new test detector was designed consisting of an embedded charge-coupled device (eCCD) and a readout integrated circuit (ROIC), combined as a silicon-bonded design. This approach enables operation at a line rate up to 150 kHz and a full well capacity above 150 ke-, thus making it very promising for high-spatial-resolution imaging systems. An FPGA-based engineering model environment with high design flexibility distributes all eCCD clocking and ROIC control signals. The unidirectional eCCD design is optimized for electrical charge injection tests and is used to verify in-orbit initialization approaches, including eCCD signal reconstruction. The paper will outline this procedure. Due to the accessible detector building blocks, this setup is ideally suited for future evaluation and verification of accumulative radiation effects on the eCCD and ROIC structures and determining possible corrective actions to contain overall radiation-related performance degradation over the mission lifetime. The evaluated method is intended to estimate the sensor’s behavior under space environmental conditions during the entire mission by introducing a detector initialization phase.

Proceedings Article | 30 September 2022 Presentation + Paper

In-orbit real-time CMOS TDI detector validation and control to meet constant imaging quality over the mission life time

Johannes Buschek, Kristian Manthey, Andreas Eckardt, Ralf Reulke, Gerhard Kahmen

Proceedings Volume 12232, 1223205 (2022) https://doi.org/10.1117/12.2631978

KEYWORDS: Sensors, Image quality, Signal detection, Signal to noise ratio, Modulation transfer functions, Point spread functions, Image sensors, Charge-coupled devices

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The Institute of Optical Sensor Systems (OS) at the Robotics and Mechatronics Center of the German Aerospace Center (DLR) has more than 35 years of experience with high-resolution imaging and imaging technology. This paper shows the institute’s scientific results of a hardware driven method to validate the image quality and keep it constant over the whole mission life time. This technology is applicable for highest resolution systems as well as for systems which are foreseen to measure reproducible data series over years. The technology is applicable for panchromatic and multispectral instrument designs. The paper will first define image quality, which is described by modulation transfer function, signal to noise ratio, spatial and spectral resolution, linearity and other key parameters. They are shown the differences in the quality assessment compared to the classic image-based methods. Within an in-orbit initialization phase of the instrument, the full electrical channel is validated by generating a defined amount of electrons instead of electrons coming from the photodiode. The approach is based on charge injection with a reproducible number of electrons which is driving the complete vertical pixel chain. The basic idea is to generate a periodic signal in orbit which can be analyzed with respect to radiation influences. The control timing of the FPGA sensor controller can be operated from ground via commanding. This procedure includes also the initialization mode by controlling the phase adjustment of the CDS sampling. The possible image degradation as a result of typical radiation effects over the mission life time is described in the paper as well as how such effects can be avoided in future by implantation of the proposed method. This new approach enables e.g. linearity test, analysis and alignment and shows the relevance of such a validation technology for high-resolution optical space instruments.

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