Guy Godin
Research Officer at National Research Council Canada
SPIE Involvement:
Author
Publications (14)

Proceedings Article | 28 February 2020 Presentation + Paper
Jonathan Boisvert, Marc-Antoine Drouin, Guy Godin, Michel Picard
Proceedings Volume 11294, 112940L (2020) https://doi.org/10.1117/12.2545382
KEYWORDS: Augmented reality, 3D metrology, Cameras, Projection systems, Manufacturing, Imaging systems, Thermography, Computing systems, 3D image processing, Inspection

Proceedings Article | 28 February 2020 Presentation + Paper
Marc-Antoine Drouin, Jonathan Boisvert, Guy Godin, Louis-Guy Dicaire, Michel Picard
Proceedings Volume 11294, 112940K (2020) https://doi.org/10.1117/12.2545377
KEYWORDS: Structured light, 3D image capture, Projection systems, Augmented reality, Cameras, Inspection, Imaging systems, Digital micromirror devices

Proceedings Article | 28 February 2020 Presentation + Paper
Marc-Antoine Drouin, Guy Godin, Michel Picard, Jonathan Boisvert, Louis-Guy Dicaire
Proceedings Volume 11294, 112940O (2020) https://doi.org/10.1117/12.2543247
KEYWORDS: Projection systems, Digital micromirror devices, Cameras, Binary data, Imaging systems, 3D metrology, Structured light, 3D image processing, Optical components, 3D modeling

Proceedings Article | 1 March 2019 Paper
Lama Seoud, Jonathan Boisvert, Marc-Antoine Drouin, Michel Picard, Guy Godin
Proceedings Volume 10937, 109370I (2019) https://doi.org/10.1117/12.2508903
KEYWORDS: Image segmentation, Sensors, Image sensors, Cameras, Imaging systems, Projection systems, 3D modeling, 3D image processing, Data acquisition

Proceedings Article | 29 January 2007 Paper
François Blais, John Taylor, Luc Cournoyer, Michel Picard, Louis Borgeat, Guy Godin, J.-Angelo Beraldin, Marc Rioux, Christian Lahanier, Bruno Mottin
Proceedings Volume 6491, 649106 (2007) https://doi.org/10.1117/12.705411
KEYWORDS: 3D modeling, 3D scanning, Laser scanners, 3D image processing, Stereoscopy, Infrared radiation, Infrared photography, Infrared imaging, Scanners, Head

Showing 5 of 14 publications
Conference Committee Involvement (2)
3D Imaging Metrology
24 January 2011 | San Francisco Airport, California, United States
3D Imaging Metrology
19 January 2009 | San Jose, California, United States
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