Ms. Hana Bendada Profile

Hana Bendada

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Proceedings Article | 20 August 2020 Poster

Studying geometric phase optical elements with polarimetry

Oriol Arteaga, Hana Bendada

Proceedings Volume 11460, 114601L (2020) https://doi.org/10.1117/12.2567641

KEYWORDS: Optical components, Polarimetry, Phase measurement, Lenses, Polarization, Diffraction, Diffraction gratings, Interferometry, Microscopy, Colorimetry

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Optical components based on Pancharatman-Berry phase feature a polarization-dependent diffraction that can be used to fabricate lenses and gratings with unique properties. In recent years, the great progress made in the fabrication of the metasurfaces required for these optical components has lowered their cost and has made them widely available. One of the often overlooked properties of optical components based on geometrical phases is that, contrary to dynamical phases, their phase can be measured using a polarimetric technique without need to resorting to interferometry methods. This is possible because the Pancharatnam-Berry phase is not controlled by an optical path difference; it results from a space variant polarization manipulation. In this work we apply Mueller matrix microscopy to measure the geometrical phase of GP lenses and polarization gratings. We show that a single space resolved Mueller matrix measurement with micrometric resolution is enough to obtain a full characterization phase-profile of these GP-based optical components and evaluate their performance.The analysis can be extended to multiple wavelengths to study the chromatic dependence of the optical parameters of the lens or the grating.

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