Mr. Hao Wang Profile

Hao Wang

at China Academy of Railway Sciences Corp., Ltd.

SPIE Involvement:

Author

Publications (1)

This will count as one of your downloads.

You will have access to both the presentation and article (if available).

DOWNLOAD NOW

This content is available for download via your institution's subscription. To access this item, please sign in to your personal account.

Email or Username Forgot your username?

Password Forgot your password?

Show

Keep me signed in

No SPIE account? Create an account

Proceedings Article | 12 March 2021 Paper

Research on application of Scheimpflug condition in rail profile measurement

Le Wang, Qian Zhou, Yue Fang, Shengchun Wang, Hao Wang, Shengwei Ren, Guoqing Li, Peng Dai

Proceedings Volume 11763, 117637P (2021) https://doi.org/10.1117/12.2587466

Read Abstract +

In recent years, structured light measurement technology has been widely used in rail profile measurement. Due to the small depth of field of the conventional rail profile measurement with linear structured light, the imaging problem of defocusing blur occurs in the area of rail waist and rail bottom, which leads to low accuracy of rail profile measurement. Therefore, the Scheimpflug condition is applied to the rail profile measurement system with linear structured light, and a constant focus optical path for rail profile measurement is designed. The results show that compared with the conventional measurement optical path, the depth of field of the imaging system is expanded from less than 90 mm to 210 mm, the width of the light strip at the rail waist and rail bottom is reduced and the energy is more concentrated. At the same time, the clear imaging of the rail head, rail waist and rail bottom is ensured, and the rail profile measurement error is reduced from 0.094 mm to 0.071 mm. This method can solve the problem of low measurement accuracy caused by defocusing blur in traditional measurement optical path, and provide a reference for the application of Scheimpflug condition in rail profile measurement.

My Library

You currently do not have any folders to save your paper to! Create a new folder below.

Folder Name

Folder Description

View contact details

UPDATE YOUR PROFILE

Is this your profile? Update it now.

Sign into your SPIE.org account

Don’t have a profile and want one?

Create an account on SPIE.org

Access to the requested content is limited to institutions that have purchased or subscribe to SPIE eBooks. You are receiving this notice because your organization may not have SPIE eBooks access.*

*Shibboleth/Open Athens users─please sign in to access your institution's subscriptions.

To obtain this item, you may purchase the complete book in print or electronic format on SPIE.org.

ORGANIZATIONAL
Sign in with credentials provided by your organization.

Organizational Username

Organizational Password

Show/Hide Password

INSTITUTIONAL
Select your institution to access the SPIE Digital Library.

SELECT YOUR INSTITUTION

PERSONAL
Sign in with your SPIE account to access your personal subscriptions or to use specific features such as save to my library, sign up for alerts, save searches, etc.

PERSONAL SIGN IN

No SPIE Account? Create one

PURCHASE THIS CONTENT

SUBSCRIBE TO DIGITAL LIBRARY

50 downloads per 1-year subscription

Members: $195

Non-members: $335 ADD TO CART

25 downloads per 1 - year subscription

Members: $145

Non-members: $250 ADD TO CART

PURCHASE SINGLE ARTICLE

Includes PDF, HTML & Video, when available

Members:

Non-members: ADD TO CART

Keywords/Phrases

Search In:

Publication Years